Error analysis of the crystal orientations and disorientations obtained by the classical electron backscatter diffraction technique

Ram, Farangis; Zaefferer, Stefan; Jäpel, Tom; Raabe, Dierk

doi:10.1107/s1600576715005762

Cited by 56 publications

(44 citation statements)

References 71 publications

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“…• , which has been confirmed by experimental 40 measurements [15]. For tilted samples, distortion of EBSD images has been pointed out [16,17], and a geometric transformation has been proposed to correct the distortion based on SEM images on non tilted samples.…”

Section: Introductionmentioning

confidence: 63%

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On the use of SEM correlative tools for in situ mechanical tests

et al. 2018

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In situ SEM mechanical tests are key to study crystal plasticity. In particular, imaging and diffraction (EBSD) allow microstructure and surface kinematics to be monitored all along the test. However, to get a full benefit from different modalities, it is necessary to register all images and crystallographic orientation maps from EBSD into the same frame. Different correlative approaches tracking either Pt surface markings, crystal orientations or grain boundaries, allow such registrations to be performed and displacement as well as rotation fields to be measured, a primary information for crystal plasticity identification. However, the different contrasts that are captured in different modalities and unavoidable stage motions also give rise to artifacts that are to be corrected to register the different information onto the same material points. The same image correlation tools reveal very powerful to correct such artifacts. Illustrated by an in situ uniaxial tensile test performed on a bainitic-ferritic steel sample, recent advances in image correlation techniques are reviewed and shown to provide a comprehensive picture of local strain and rotation maps.

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Section: Introductionmentioning

confidence: 63%

“…The surface is normal to the electron beam for BSE images 15 and is subsequently tilted for EBSD imaging. Matching the coordinates system of the two images is an issue seldom reported in the literature.…”

Section: Introductionmentioning

confidence: 99%

On the use of SEM correlative tools for in situ mechanical tests

et al. 2018

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“…Orientation maps in Figure 9 Finally, for quality assurance the XCF peak height map for matching is also presented ( Figure 9 & 10 part H) and this can be used as a filtering metric for removing suspect points, similar to the image quality in the Hough based method [33]. The red x on the map in A shows the location the pattern was extracted from.…”

Section: Si Single Crystalmentioning

confidence: 99%

Indexing electron backscatter diffraction patterns with a refined template matching approach

et al. 2019

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Graphical AbstractAbstract Electron backscatter diffraction (EBSD) is a well-established method of characterisation for crystalline materials. Using this technique, we can rapidly acquire and index diffraction patterns to provide phase and orientation information about the crystals on the material surface. The conventional analysis method uses signal processing based on a Hough/Radon transform to index each diffraction pattern. This method is limited to the analysis of simple geometric features and ignores subtle characteristics of diffraction patterns, such as variations in relative band intensities. A second method, developed to address the shortcomings of the Hough/Radon transform, is based on template matching of a test experimental pattern with a large library of potential patterns. In the present work, the template matching approach has been refined with a new cross correlation function that allows for a smaller library and enables a dramatic speed up in pattern indexing. Refinement of the indexed orientation is performed with a follow-up step to allow for small alterations to the best match from the library search. The refined template matching approach is shown to be comparable in accuracy, precision and sensitivity to the Hough based method, even exceeding it in some cases, via the use of simulations and experimental data collected from a silicon single crystal and a deformed α-iron sample. The speed up and pattern refinement approaches should increase the widespread utility of pattern matching approaches.

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“…Similar approach for calibration or solving pseudosymmetry problems can be seen in some publications [27][28][29], although the systematic analysis on the calibration error, accuracy and precision has not yet been reported. Global optimisation 1 The terms, error, accuracy and precision, defined in [26] are used throughout this paper. The error is the difference between a true quantity and the measured one.…”

Section: Introductionmentioning

confidence: 99%

Pattern matching analysis of electron backscatter diffraction patterns for pattern centre, crystal orientation and absolute elastic strain determination – accuracy and precision assessment

Tanaka

Wilkinson

2019

Ultramicroscopy

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Pattern matching between target electron backscatter patterns (EBSPs) and dynamically simulated EBSPs was used to determine the pattern centre (PC) and crystal orientation, using a global optimisation algorithm. Systematic analysis of error and precision with this approach was carried out using dynamically simulated target EBSPs with known PC positions and orientations. Results showed that the error in determining the PC and orientation was < 10 -5 of pattern width and < 0.01° respectively for the undistorted full resolution images (956×956 pixels). The introduction of noise, optical distortion and image binning was shown to have some influence on the error although better angular resolution was achieved with the pattern matching than using conventional Hough transform-based analysis. The accuracy of PC determination for the experimental case was explored using the High Resolution (HR-) EBSD method but using dynamically simulated EBSP as the reference pattern. This was demonstrated through a sample rotation experiment and strain analysis around an indent in interstitial free steel.3

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Error analysis of the crystal orientations and disorientations obtained by the classical electron backscatter diffraction technique

Cited by 56 publications

References 71 publications

On the use of SEM correlative tools for in situ mechanical tests

On the use of SEM correlative tools for in situ mechanical tests

Indexing electron backscatter diffraction patterns with a refined template matching approach

Pattern matching analysis of electron backscatter diffraction patterns for pattern centre, crystal orientation and absolute elastic strain determination – accuracy and precision assessment

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