2009 59th Electronic Components and Technology Conference 2009
DOI: 10.1109/ectc.2009.5074023
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Establishing fracture properties of EMC-Copper interfaces in the visco-elastic temperature region

Abstract: An ongoing root cause of failure in microelectronic industry is interface delamination. In order to explore the risk of interface damage, FE simulations for the fabrication steps as well as for the testing conditions are generally made in the design stage. In order to be able to judge the risk for interface fracture, the critical fracture properties of the interfaces being applied should be available, for the occurring combinations of temperature and moisture preconditioning. As a consequence there is an urgen… Show more

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Cited by 12 publications
(4 citation statements)
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“…However, using these methods, a sharp initial crack is not always obtained. For the present delamination study the method earlier developed by Xiao [1][2][3] is used. Here a sharp initial crack is obtained through the following processing steps (as indicated in figure 3).…”
Section: Sample Preparationmentioning
confidence: 99%
See 1 more Smart Citation
“…However, using these methods, a sharp initial crack is not always obtained. For the present delamination study the method earlier developed by Xiao [1][2][3] is used. Here a sharp initial crack is obtained through the following processing steps (as indicated in figure 3).…”
Section: Sample Preparationmentioning
confidence: 99%
“…For the present study we chose a Mixed Mode Bending set up, analog to the MMB set up, as earlier developed for delamination measurements on real production samples by Xiao, e.a. [1][2][3]. Firstly, harsh environment measurements were performed under "pressure cooker" conditions (Temp>100 °C & RH=100%), as these are considered as the most severe conditions for humidity-interface toughness reduction.…”
Section: Introductionmentioning
confidence: 99%
“…Researches showed that, using these methods, a sharp initial crack is not always obtained. For the present delamination study the method earlier developed by Xiao [1][2][3] is used. Here a sharp initial crack is obtained through the following processing steps (as indicated in figure 1).…”
Section: Sample Preparationmentioning
confidence: 99%
“…For the present study we chose a Mixed Mode Bending set up, analog to the MMB set up, as earlier developed for delamination measurements on real production samples by Xiao, e.a. [1][2][3]. For the first time, the interface delamination toughness measurement is perfonned in under "pressure cooker" condition (Temp> 1 00 °C & RH=lOO%).…”
Section: Introductionmentioning
confidence: 99%