2015
DOI: 10.1002/sca.21216
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Establishing proper scanning conditions in atomic force microscopy on polyimide and polyurethane samples and their effect on 3D surface texture parameters

Abstract: Several atomic force microscopy (AFM) tests have been carried out on both smooth (polyimide) and rough (polyurethane) surfaces so that to obtain the best results; subsequently, the optimization of experiments performed is presented. A special emphasis has been put on the effect of tip geometry, image pre-processing procedure, scanning area, resolution, pixel size, and cantilever oscillation amplitude in tapping mode, as well as on the quality of the topographical images and 3D surface texture parameters. After… Show more

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Cited by 8 publications
(5 citation statements)
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“…It was showed that the measured height of organic samples critically depend on pixel size, as the measured average sample height decreased and standard deviation increased with increasing pixel size [108]. It was demonstrated that increasing pixel size results in an increase in the apparent surface roughness, and therefore in larger sample height deviations [112,113]. Quite generally, it is clear that imaging at insufficient resolution will cause distortions in image and will lead to deviations or lateral and vertical dimension measurements.
Fig.
…”
Section: Resolution Sensitivity and Accuracy For Single Molecule Meamentioning
confidence: 99%
“…It was showed that the measured height of organic samples critically depend on pixel size, as the measured average sample height decreased and standard deviation increased with increasing pixel size [108]. It was demonstrated that increasing pixel size results in an increase in the apparent surface roughness, and therefore in larger sample height deviations [112,113]. Quite generally, it is clear that imaging at insufficient resolution will cause distortions in image and will lead to deviations or lateral and vertical dimension measurements.
Fig.
…”
Section: Resolution Sensitivity and Accuracy For Single Molecule Meamentioning
confidence: 99%
“…25 The root mean square, evaluated adopting the plugin implemented in the Nanoscope software was adopted to characterize the surface roughness. 26 The maximum height difference within the investigated areas was selected below 300 nm, in order to minimize the curvature and height difference contribution in the evaluation of the modulus. 27 Barrier properties of water vapor were evaluated through a DVS automated multi-vapor gravimetric sorption analyzer, using dry nitrogen as a carrier gas.…”
Section: Methodsmentioning
confidence: 99%
“…The 1 × 1 μm 2 image shows a fine surface grain structure without any obvious orientation dependence. No attempt was made to deconvolute the tip geometry in the 1 × 1 μm 2 scan …”
Section: Characterization Of Tmns and Iii‐n/tmn Heterostructuresmentioning
confidence: 99%