2009
DOI: 10.1016/j.measurement.2008.12.007
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Establishment of a computer-controlled retroreflection measurement facility to characterize photometric properties of retroreflectors

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“…1). Only a very long distance between sample and detector allows to cover the peak region of highly directional retro-reflection in such direct measurements [21].…”
Section: Measurement Techniquesmentioning
confidence: 99%
“…1). Only a very long distance between sample and detector allows to cover the peak region of highly directional retro-reflection in such direct measurements [21].…”
Section: Measurement Techniquesmentioning
confidence: 99%