“…Whilst it is possible to construct systems which can switch between ion sources during an experiment [9], due to the differing energies and masses it is necessary to attach two ion beamlines to a microscope in order to explore the synergistic effects of, for example, simultaneous inert gas implantation and atomic displacements. The ion sources can often be part of a larger irradiation facility into which the TEM is incorporated and as such will also be available for ex situ irradiation experiments in target chambers on the same, or other, beamlines -for example at the University of Tokyo [10,11], National Institute for Materials Science (NIMS) [12], Argonne National Laboratory (ANL) [13][14][15][16], Hokkaido University [17], Centre de Spectrométrie Nucléaire et de Spectrométrie de Masse (CSNSM) [7,[18][19][20][21] and Wuhan University [22].…”