2014
DOI: 10.1007/s40094-014-0141-9
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Estimation of lattice strain in ZnO nanoparticles: X-ray peak profile analysis

Abstract: ZnO nanoparticles were synthesized from chitosan and zinc chloride by a precipitation method. The synthesized ZnO nanoparticles were characterized by Fourier transform infrared spectroscopy, X-ray diffraction peak profile analysis, Scanning electron microscopy, Transmission electron microscopy and Photoluminescence. The X-ray diffraction results revealed that the sample was crystalline with a hexagonal wurtzite phase. We have investigated the crystallite development in ZnO nanoparticles by X-ray peak profile a… Show more

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Cited by 1,281 publications
(462 citation statements)
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“…The value of D increases with increase of annealing temperature. The dislocation density, lattice strain, micro strain, and stacking fault for the present series samples are extracted from d = 1/D 2 (Sathyamoorthy et al 2006;Sharma et al 2011;Touati et al 2014;Bindu and Thomas 2014), e = b/ 4 9 tanh (Thool et al 2014), e = b 9 cosh/4 (Sathyamoorthy et al 2006;Sharma et al 2011) and SF = 2p 2 /45H(3tanh) (Touati et al 2014;Thool et al 2014), respectively, and their values are given in Table 1. From Table 1 we notice that the dislocation density, lattice strain, micro strain, and stacking fault for the annealed samples decrease with the increase of annealing temperature.…”
Section: Resultsmentioning
confidence: 99%
“…The value of D increases with increase of annealing temperature. The dislocation density, lattice strain, micro strain, and stacking fault for the present series samples are extracted from d = 1/D 2 (Sathyamoorthy et al 2006;Sharma et al 2011;Touati et al 2014;Bindu and Thomas 2014), e = b/ 4 9 tanh (Thool et al 2014), e = b 9 cosh/4 (Sathyamoorthy et al 2006;Sharma et al 2011) and SF = 2p 2 /45H(3tanh) (Touati et al 2014;Thool et al 2014), respectively, and their values are given in Table 1. From Table 1 we notice that the dislocation density, lattice strain, micro strain, and stacking fault for the annealed samples decrease with the increase of annealing temperature.…”
Section: Resultsmentioning
confidence: 99%
“…Small variation in the intensity and broadening of peaks represents the rearrangement of crystal plane according to synthesis conditions [23]. Also reduction of the values of cell parameters: a and c indicates the presence of some stress or strain in the crystal lattice of the samples [22,23]. The strain observed in the samples can be explained by the Uniform Deformation Model (UDM) using Williamson-Hall (W-H) plot [22,24] which claims that the diffraction line broadening is due to strain ( ) effect and reduction in crystallite size.…”
Section: X-ray Diffraction (Xrd) Analysismentioning
confidence: 99%
“…Also reduction of the values of cell parameters: a and c indicates the presence of some stress or strain in the crystal lattice of the samples [22,23]. The strain observed in the samples can be explained by the Uniform Deformation Model (UDM) using Williamson-Hall (W-H) plot [22,24] which claims that the diffraction line broadening is due to strain ( ) effect and reduction in crystallite size. The UDM equation was calculated by using the diffraction peak broadening and is given by [22,24]:…”
Section: X-ray Diffraction (Xrd) Analysismentioning
confidence: 99%
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“…3b, c), a coincidence of diffraction peaks for ZnO NCs and ZnO/GO nanocomposite is highly remarkable indicating the formation of well crystalline structure of ZnO NCs onto the GO surface. Peaks at 31.7°, 34.4°, 36.2°, 47.4°, 56.6°62.9°, 65.5°, 68.0°and 69.1°that are corresponding to (100), (002), (101), (102), (110), (103), (200), (112) and (201) lattice planes, respectively, indicating the formation of wurtzite structure with 2D hexagonal P6 3 mc space group [25,26].…”
Section: Structural Features Of Zno/go Nanocompositementioning
confidence: 99%