Estimation of secondary electron effect in the J-PARC rapid cycling synchrotron after first study

Yamamoto, Kazami; Kamiya, J.; Ogiwara, Norio; Kinsho, Michikazu; Hayashi, Naoki; Saeki, Ryuji; Satou, Kenichirou; Toyama, T.

doi:10.1016/j.apsusc.2009.05.137

Cited by 9 publications

(2 citation statements)

References 12 publications

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“…It delivers an intense proton beam to the target for neutron production in the Materials and Life Science Experimental Facility (MLF) as well as to the Main Ring (MR) synchrotron at a repetition rate of 25 Hz [1]. The RCS was commissioned in 2007 at an output beam power of 4 kW [2]. Since 2008, the RCS has provided a 3 GeV proton beam to the MLF and MR. We continued the beam commissioning effort to reduce losses in the RCS, and progress was made on increasing the output beam power.…”

Section: Introductionmentioning

confidence: 99%

Beam power and residual dose history of J-PARC RCS

Yamamoto¹,

Hotchi²,

Harada³

et al. 2014

Progress in Nuclear Science and Technology

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A 3 GeV rapid cycling synchrotron (RCS) at J-PARC was commissioned in October 2007. Afterwards, the beam intensity was increased through a beam study, and the RCS has continuously provided a proton beam >100 kW to the neutron target since October 2009. With renewed efforts brought about by beam commissioning, we have reduced losses in the RCS and achieved low-loss operation. We present the history of the operational beam power and the residual dose distributions after operation.

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Section: Introductionmentioning

confidence: 99%

Beam power and residual dose history of J-PARC RCS

Yamamoto¹,

Hotchi²,

Harada³

et al. 2014

Progress in Nuclear Science and Technology

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“…Secondary electron yield is an important research topic; thus, many authors have studied secondary electron yields and their corresponding formulas. [1][2][3][4][5][6][7][8] Many authors have researched the formulas for secondary electron yield (the subscript means the primary electron is incident at in this paper), [9][10][11][12] and have given the simple angle-yield relationship of ¼ 0 ðcos Þ Àm , where and 0 are the incident angle and the secondary electron yield at ¼ 0 , respectively, and m depends on the atomic number of the material. The increase of the backscattered coefficient with was not taken into account in this relationship, so these formulas can only give an estimate in practical applications of secondary electrons in the angle range of 0-60 .…”

Section: Introductionmentioning

confidence: 99%

Universal Formula for Secondary Electron Yield of Metals at High Electron Energy and Incident Angle θ

Xie

Zhang

Wang

2011

Jpn. J. Appl. Phys.

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On the basis of the main physical processes of secondary electron emission, the relationships among the incident energy (W p0 ) of primary electrons, the number of secondary electrons ( PE ) released per primary electron entering the metal at high electron energy and incident angle and incident angle () are deduced. In addition, the relationship between the number of secondary electrons ( PE0 ) released per primary electron entering the metal at ¼ 0 and W p0 is determined. From the experimental results, the relationships among the ratio (the subscript means the primary electron is incident at in this paper), the ratio at ¼ 0 ( 0 ) and are obtained. On the basis of relationships among PE , PE0 , , 0 , backscattered coefficient , backscattered coefficient at ¼ 0 ( 0 ), secondary electron yield , and secondary electron yield at ¼ 0 ( 0 ), the universal formula for expressing using 0 , , 0 , and is deduced. The secondary electron yield calculated from this universal formula and the yields measured experimentally from aluminum and copper are compared. The results suggest that the proposed formula is universal for the estimation of secondary electron yields in the angle range of 0-80 and the energy range of 10-102 keV.

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