2011
DOI: 10.1088/1742-6596/289/1/012014
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EuNiO3thin films- growth and characterization

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Cited by 3 publications
(2 citation statements)
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“…The first peak is most probably related to surface contamination by carbon, as was suggested in Ref. [32]. The peaks position of Si 2P and C 1s is typical for organosilicate based low-k materials [33] and does not change during the depth profiling.…”
Section: X-ray Photoelectron Spectroscopy Analysis (Xps)supporting
confidence: 62%
“…The first peak is most probably related to surface contamination by carbon, as was suggested in Ref. [32]. The peaks position of Si 2P and C 1s is typical for organosilicate based low-k materials [33] and does not change during the depth profiling.…”
Section: X-ray Photoelectron Spectroscopy Analysis (Xps)supporting
confidence: 62%
“…Typically, sub-nanometer resolution images of the microstructure are obtained after sample microtoming (cross section image with transmission electron microscopies 13 ). In-depth chemical and physical analysis can also be performed by slicing the material and analyzing either the removed matter (secondary ion mass spectroscopy 14 ) or the newly created surface (ion-sputteringassisted X-ray and ultraviolet photoemission spectroscopy 15 ). Because of the importance of nanometrology development for industry, special efforts are still needed to realize a breakthrough in subsurface investigation methods.…”
mentioning
confidence: 99%