Evaluation of a cesium positive ion source for secondary ion mass spectrometry

Storms, H. A.; Brown, Kenneth; Stein, John D.

doi:10.1021/ac50021a034

Cited by 340 publications

(126 citation statements)

References 17 publications

Supporting

Mentioning

119

Contrasting

Unclassified

Order By: Relevance

“…According to Stroms et al,11) in the case of H, C, and O elements, more precise results can be obtained using a Cs þ ion beam, because their relative ion yields using this beam are several thousands times higher than those in the case of using an O À ion beam. On the other hand, in the case of metallic elements such as Al, Si, Ti and Fe, that are positively ionized, an O À ion bombardment is currently used in SIMS analysis to produce high positive ion yield providing greater analytical sensitivity.…”

Section: Resultsmentioning

confidence: 99%

Influence of Substrate Bias Voltage on the Impurity Concentrations in Hf Films Deposited by Ion Beam Deposition Method

et al. 2006

View full text Add to dashboard Cite

Hf films have been deposited on Si(100) substrate with or without a substrate bias voltage using a non-mass separated ion beam deposition (IBD) method. Secondary ion mass spectrometry (SIMS) and glow discharge mass spectrometry (GDMS) have been used to determine impurity concentrations of Hf films and a Hf target. By the SIMS results with Cs þ and O 2 þ ion beams, the Hf film deposited at V s ¼ 0 V contains more impurities than the Hf film deposited at V s ¼ À50 V. In addition, from GDMS results for the Hf target and the Hf films deposited at V s ¼ 0 and À50 V, almost all the impurities have reduced by applying a negative substrate bias voltage. It means that applying a negative bias voltage to the substrate can decrease the impurity concentrations in Hf films.

show abstract

Section: Resultsmentioning

confidence: 99%

Influence of Substrate Bias Voltage on the Impurity Concentrations in Hf Films Deposited by Ion Beam Deposition Method

et al. 2006

View full text Add to dashboard Cite

show abstract

“…Minerals containing much of sodium oxide and potassium oxide are colorless and hence only slightly sensitive to visible light or near-infrared radiation. Since the yield of secondary ions correlates closely with the ionization energy (Storms et al, 1977), remote SIMS analysis of the lunar surface would be especially effective in detecting alkali species with lower ionization energies. The variation in alkali abundance is a key to indicating the compositional differences of the magma resource.…”

Section: Discussionmentioning

confidence: 99%

Estimation of picked-up lunar ions for future compositional remote SIMS analyses of the lunar surface

Yokota

Saito

2005

Earth Planet Sp

View full text Add to dashboard Cite

In situ measurement of Moon-originating ions picked-up in orbit round the Moon is expected to provide valuable information regarding the thin lunar atmosphere and surface. Secondary ions sputtered by the solar wind ions reflect the surface abundance. Global composition mapping of the lunar surface may be thus achieved by measuring the sputtered ions as one would perform laboratory SIMS. We studied the dynamics of picked-up lunar ions when the Moon was exposed to the solar wind. Our model's source mechanism involved photoionization of the lunar exospheric atoms, photon-stimulated ion desorption, and ion sputtering. We propose that an intense flux of picked-up lunar ions (10 4 /cm 2 sec) exists at an altitude of 100 km, for nearly a quarter of the orbit. The ion flux originating from the lunar surface is mono-directional and mono-energetic, and is distinguishable from that of lunar atmospheric origin whose energy spectra correspond to their spatial distribution. Our calculation suggested that ion measurements in orbit round the Moon enable remote SIMS analyses.

show abstract

“…In the carbon area, some sulfates and nitrates could be detected because the number of Na + and K + ions was much less than that in the sulfate area, and these ions were highly sensitive to the analysis using SIMS. 10 In the second mapping (Fig. 1(b2)), carbon was located next to sulfates.…”

Section: Chemical Composition Of the Small Solidsmentioning

confidence: 97%

Characterization of Black Carbon in Fine Aerosol Particles Using High Lateral Resolution TOF-SIMS

et al. 2013

View full text Add to dashboard Cite

Evaluation of a cesium positive ion source for secondary ion mass spectrometry

Cited by 340 publications

References 17 publications

Influence of Substrate Bias Voltage on the Impurity Concentrations in Hf Films Deposited by Ion Beam Deposition Method

Influence of Substrate Bias Voltage on the Impurity Concentrations in Hf Films Deposited by Ion Beam Deposition Method

Estimation of picked-up lunar ions for future compositional remote SIMS analyses of the lunar surface

Characterization of Black Carbon in Fine Aerosol Particles Using High Lateral Resolution TOF-SIMS

Contact Info

Product

Resources

About