“…The technique uses light that is split, directed, and reflected from an object and a reference surface, and generates fringes from the interference of these two beams (Schmit et al, 2008). Characteristic interference patterns are translated into topographical images by computer software (Cross et al, 2009). It allows the nondestructive, noncontact, fast, and wide‐field measurements with vertical resolution down to a fraction of a nanometer (Schmit et al, 2008).…”