2013
DOI: 10.1109/ted.2013.2273796
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Evaluation of Electron Trapping Speed of AlGaN/GaN HEMT With Real-Time Electroluminescence and Pulsed $I{-}V$ Measurements

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Cited by 18 publications
(18 citation statements)
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“…However, it was confirmed that breakdown voltage decreased with increased device gate width (W g ). In this paper, we studied the impact on V br characteristic of device electrode pattern and corresponding EL emission, due to electric field concentration [3,4].…”
Section: Introductionmentioning
confidence: 99%
“…However, it was confirmed that breakdown voltage decreased with increased device gate width (W g ). In this paper, we studied the impact on V br characteristic of device electrode pattern and corresponding EL emission, due to electric field concentration [3,4].…”
Section: Introductionmentioning
confidence: 99%
“…Despite the superior performance of high power applications using GaN-based HEMTs, the large gate leakage current of HEMTs is still under discussion [2][3][4][5][6][7][8]. One mechanism is current flow through dislocations and defects in the epitaxial layer [2,3], which may be supported by spot-shape emission in electroluminescence (EL) [5][6][7][8][9][10][11][12]. So far, the spot-shape EL has been observed only at the gate edge in the case of front-side observation [6-8, 10, 11].…”
mentioning
confidence: 99%
“…For EL measurements, an emission microscope PHEMOS-1000 by Hamamatsu Photonics K.K. was used, in which a silicon intensified charge-coupled device (SI-CCD) camera is installed [11,12]. The spectral response of the SI-CCD camera extends from 300 to 1100 nm, which covers the expected luminescence spectrum from AlGaN/GaN HEMTs (500-950 nm).…”
mentioning
confidence: 99%
“…Electroluminescence (EL) measurement is a powerful method for analysis of electric field distribution in AlGaN/GaN HEMTs. [15][16][17][18][19][20][21][22][23][24][25] The high electric field region in HEMTs can be identified by EL location. In the case of HEMTs with severe current collapse, EL was observed at the drain edge.…”
Section: Introductionmentioning
confidence: 99%
“…Furthermore, some literatures mentioned when HEMTs was under continuous biasing, EL shifted from the gate edge toward the drain electrode, indicating a transition of the high electric field region. [17][18][19] In addition, EL color was used to explore a distribution of an electron energy. HEMTs with high energy hot electrons exhibited a high-intensity whitish EL, whereas HEMTs with relatively low energy hot electrons exhibited a weak reddish EL.…”
Section: Introductionmentioning
confidence: 99%