2015
DOI: 10.1007/s11664-015-3642-7
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Evaluation of Electroplated Co-P Film as Diffusion Barrier Between In-48Sn Solder and SiC-Dispersed Bi2Te3 Thermoelectric Material

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Cited by 14 publications
(9 citation statements)
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“…Figure 1D‐F shows the numerical results of the TE couple at T h = 500 K, T c = 300 K, and h a = 0. Here, the solder layer between the semiconductors and copper electrodes is omitted because its thickness is quite small 44 . Besides, the thermal conductivity and electric conductivity of solder materials are close to those of electrode materials (ie, copper), and the electric resistance of the solder layer and electrodes is approximately one‐thousandth of that of the TE legs.…”
Section: Comprehensive Analysis Of a Conventional π‐Type Te Couplementioning
confidence: 99%
“…Figure 1D‐F shows the numerical results of the TE couple at T h = 500 K, T c = 300 K, and h a = 0. Here, the solder layer between the semiconductors and copper electrodes is omitted because its thickness is quite small 44 . Besides, the thermal conductivity and electric conductivity of solder materials are close to those of electrode materials (ie, copper), and the electric resistance of the solder layer and electrodes is approximately one‐thousandth of that of the TE legs.…”
Section: Comprehensive Analysis Of a Conventional π‐Type Te Couplementioning
confidence: 99%
“…In addition to the metal Ni and Co, metallic thin films, including Pd, Pt, binary Ni-7 at% V and ternary Ta-Si-N, are effective diffusion barriers for Bi 2 Te 3 -based modules [34]. Among them, the ternary Ta-Si-N (100 nm in thickness) successfully prevents the out-diffusion of constituent elements in Bi 2 Te 3, , and acts as effective diffusion barrier layer [34].…”
Section: Diffusion Barrier In Bi 2 Te 3 -Based Modulesmentioning
confidence: 99%
“…Among them, the ternary Ta-Si-N (100 nm in thickness) successfully prevents the out-diffusion of constituent elements in Bi 2 Te 3, , and acts as effective diffusion barrier layer [34].…”
Section: Diffusion Barrier In Bi 2 Te 3 -Based Modulesmentioning
confidence: 99%
“…CoSn, CoSn 2 , and CoSn 3 IMCs have been observed in various Co/Sn solder joints [27][28][29][30][31][32][33][34][35][36]. CoSn 3 appears most frequently at the interface of Co/Sn joints, and it has a strong impact on the shear strength of the joints [5,27,[30][31][32][33].…”
Section: Introductionmentioning
confidence: 99%
“…Recently, Co-based UBM has attracted considerable interest because of slow interfacial reaction between Co-based UBM and solders, large joint strength, good joint reliability, and acceptable wettability [26][27][28][29][30][31][32][33][34][35][36][37][38]. Electroless Co-Ni-P metallization has been studied, and Co-Ni-P has shown a slower consumption rate and better resistance to joint-strength degradation during a long-term thermal aging in comparison with Ni-P [26].…”
Section: Introductionmentioning
confidence: 99%