Evaluation of HgI/sub 2/ detectors for lead detection in paint

Wang, Y.J.; Iwanczyk, Jan S.

doi:10.1109/23.256672

Cited by 10 publications

(2 citation statements)

References 9 publications

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“…The ionization energy required for silicon is ~3.6 eV and for germanium is ~2.9 eV, which is one order magnitude smaller than that of gas-filled and scintillators detectors. Variety of semiconductor materials like Si, Ge, HgI2 [26], CdTe [27], CdZnTe [28] and GaAs [29] were considered for nuclear spectroscopy applications and among these detector materials, silicon and germanium are widely used in practice. The compound semiconductor detectors CdTe, CdZnTe are also increasingly used in spectrometry applications in the high energy X-ray region.…”

Section: Semiconductor Detectorsmentioning

confidence: 99%

Untitled

2023

J. Rad. Nucl. Appl.

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This paper provides a review of radiation detectors to measure the ionizing radiation like gamma-ray, X-ray, high energy UV-ray and heavy ions, etc. It is essential to know about the radiation source and its effects for several applications such as aviation, medical, high energy physics experiments and space missions. In the last few decades, numerous detectors with different manufacturing technologies have been reported. Semiconductor devices such as diodes, metal-oxide-semiconductor field-effect transistors (MOSFETs) and solid-state photomultipliers (SSPMs), etc., have been made and widely used to measure different kind of radiation. This article goes through the evolution of radiation detectors design using various technologies and summarizes the features with emphasis on their underlying principles and applications.

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Section: Semiconductor Detectorsmentioning

confidence: 99%

Untitled

2023

J. Rad. Nucl. Appl.

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“…In the last five years there was an impressive improvement in the field of thermoelecthcally cooled small X-ray detectors, and new X-ray detectors become available (Si-PIN by AMPTEK [1] and Hg12 by XSIRJIJS [2]) or old detectors with better performances (CZT by AMPTEK and Si-strip by Fiorini, et a!. [3}).…”

Section: Introductionmentioning

confidence: 99%

<title>Thermoelectrically cooled semiconductor detectors for portable energy-dispersive x-ray fluorescence equipment</title>

Cesáreo

Castellano²,

Fiorini

et al. 1997

SPIE Proceedings

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Thermoelectrically cooled semiconductor detectors, such as Si-PIN, Si-strip and Hg12, coupled to miniaturized low-power Xray tubes, are well suited for constructing portable systems for energy-dispersive X-ray fluorescence analysis (EDXRF) of samples of archaeological interest. The Si-PIN detector is characterized by a thickness of about 3OOim, an area of about 2x3 mm2, an energy resolution of about 250-300 eV at 5.9 keV and an entrance window of75 jim. The Si-strip detector has approximate the same area and thickness, but an energy resolution of 145 eV at 5.9keV. The efficiency of these detectors is around 100% from 4 to 10 keV, and then decreases versus energy, reaching 10% at 30 keV. Coupled to a miniaturized 10 kV, 0. 1 mA, Ca-anode or to a miniaturized 30 kV, 0. 1 mA, W-anode X-ray tubes, completely portable systems can be constructed, which are able to analyze K-lines of elements up to about silver, and L-lines of heavy elements. The Hg12 detector has an efficiency of about 100% in the whole range of X-rays, and an energy resolution of about 200 eV at 5.9 keV. Coupled to a small 50 kV, 1 mA, W-anode X-ray tube, a portable system can be constructed, for analysis of practically all elements. These equipments were applied to analysis in the field of archaeometry and in all applications for which portable systems are needed or at least usefiui (for example X-ray transmission measurements, X-ray microtomography and so on). More specifically, concerning EDXRF analysis, ancient gold samples were analyzed in Rome, in Mexico City and in Milan, nuragic bronzes in Sassari, ceramics of various origin in Merida, La Habana and Sassari, and sulfur (due to pollution) in an old roman fresco in S.Stefano Rotondo (Rome).Concerning transmission measurements, ancient copper coins and wood samples were analyzed, and microtomographic measurements are in progress to improve the quality of the image.

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Portable Systems for Energy‐DispersiveX‐Ray Fluorescence

Cesareo¹,

Gigante²,

Castellano³

et al. 2000

Encyclopedia of Analytical Chemistry

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Portable energy‐dispersive X‐ray fluorescence (EDXRF) spectrometers are becoming very popular in many fields for the on‐site analysis of elements. This is mainly because EDXRF is a nondestructive, multielemental technique that is extremely well suited for the analysis of any material. An EDXRF spectrometer mainly consists of an X‐ or γ‐ray excitation source, an X‐ray detector with electronics, and a pulse height analyzer. Recent technological developments have resulted in small, low‐power, dedicated X‐ray tubes, thermoelectrically cooled semiconductor detectors, and small pulse height analyzers. Therefore, completely portable EDXRF spectrometers are available that can be assembled on‐site, having the size of a book and a weight ranging from as light as 500 g (using a radioactive source) to a few kilograms (using an X‐ray tube). These spectrometers can be employed for on‐site analysis in various fields, such as works of art, alloys, soil, environmental samples, forensic medicine, paper, waster materials, mineral ores and their products, or anywhere a portable apparatus would be required. This paper reviews the present status of the development and application of EDXRF portable systems. The various components of a portable system are described: the radiation source, i.e. small, low‐power, dedicated X‐ray tubes or alternatively radioactive sources that emit X‐rays or low‐energy γ‐rays; and X‐ray detectors, i.e. scintillators, proportional gas counters and semiconductor detectors, with special emphasis on the recent thermoelectrically cooled X‐ray detectors: Si‐PIN (silicon positive–intrinsic– negative), Si‐strip and CZT (cadmium–zinc–telluride). Commercial systems are considered, and finally the most common and significant applications are described.

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Evaluation of HgI/sub 2/ detectors for lead detection in paint

Cited by 10 publications

References 9 publications

Untitled

Untitled

<title>Thermoelectrically cooled semiconductor detectors for portable energy-dispersive x-ray fluorescence equipment</title>

Portable Systems for Energy‐DispersiveX‐Ray Fluorescence

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