2021 IEEE 1st International Power Electronics and Application Symposium (PEAS) 2021
DOI: 10.1109/peas53589.2021.9628884
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Evaluation of High-Voltage 4H-SiC Gate Turn-off Thyristor for Pulsed Power Application

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Cited by 3 publications
(6 citation statements)
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“…This would indicate that both increasing the dc‐link voltage and enhancing the carrier lifetimes, especially for the N base and P base layers, would effectively accelerate the lateral spreading rate of the plasma, and thus make positive effects on improving the extremely current rise period. Pulsed power tests at a wide range of dc‐link voltages are carried out by the use of the homemade SiC GTO [4]. These results are plotted in Figure 10.…”
Section: Discussion On Extremely Slow Current Rise Transientmentioning
confidence: 99%
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“…This would indicate that both increasing the dc‐link voltage and enhancing the carrier lifetimes, especially for the N base and P base layers, would effectively accelerate the lateral spreading rate of the plasma, and thus make positive effects on improving the extremely current rise period. Pulsed power tests at a wide range of dc‐link voltages are carried out by the use of the homemade SiC GTO [4]. These results are plotted in Figure 10.…”
Section: Discussion On Extremely Slow Current Rise Transientmentioning
confidence: 99%
“…However, several problems hinder the development of SiC GTO specifically for the pulse power applications. Firstly, the tested pulsed current waveforms of high‐voltage SiC GTO thyristors from both our homemade one and those fabricated by Cree Inc. have confirmed that there is one extremely slow current rise process during the initial current pulse stage, which greatly degrades the turn‐on performance and generates a large gap from the expected di/dt , but this phenomenon has been inadvertently ignored by researchers till now (see Figure 1) [4, 14, 15]. Secondly, the current crowding phenomenon during the turn‐on transient has greatly threatened the high‐stress robustness and long‐term reliability of SiC GTO under repetitive pulsed current conditions [16, 17].…”
Section: Introductionmentioning
confidence: 91%
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