2003
DOI: 10.2472/jsms.52.764
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Evaluation of Residual Stress Distribution in Shot-Peened Steel by Synchrotron Radiation

Abstract: The in-depth distribution of residual stresses in shot-peened steels was measured by using high energy X-rays posed to estimate the stress value of the distributed residual stress. The new method was a combination of the sidethe distribution obtained by the surface removal method.

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Cited by 29 publications
(16 citation statements)
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“…This beam line yields X-rays with energy levels ranging from 5 and 115 keV and is equipped with a seven-circle goniometer. The constant penetration depth method (Akiniwa et al , 2003; Akiniwa and Kimura, 2008; Bonarski et al , 1994; Kumar et al , 2006) was adopted for the stress measurement by using high-energy X-rays with energy levels from 10 to 72 keV. Several diffraction profiles of single peaks and overlapping peaks were used for stress measurement.…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…This beam line yields X-rays with energy levels ranging from 5 and 115 keV and is equipped with a seven-circle goniometer. The constant penetration depth method (Akiniwa et al , 2003; Akiniwa and Kimura, 2008; Bonarski et al , 1994; Kumar et al , 2006) was adopted for the stress measurement by using high-energy X-rays with energy levels from 10 to 72 keV. Several diffraction profiles of single peaks and overlapping peaks were used for stress measurement.…”
Section: Methodsmentioning
confidence: 99%
“…The penetration depth was set to be from 0.5 to 250 μ m and was calculated by Eq. (1) (Akiniwa et al , 2003; Akiniwa and Kimura, 2008), where θ 0 is the diffraction angle from stress-free materials and μ is the linear absorption coefficient. The values of ω and χ are angles of inclination between the incident X-rays and the specimen surface.…”
Section: Methodsmentioning
confidence: 99%
“…However, the wavelength of light sources used at a laboratory is too long for measuring the internal residual stress. Then the residual stress measurement in the in-plane direction under the subsurface using constant penetration depth method 14) was performed at BL22XU at SPring-8, where the short wavelength can be used and the internal residual stress can be measured. The X-ray energies were 0.04130 and 0.01856 nm and the irradiated area made by divergent slit was 1:0 Â 0:2 mm 2 .…”
Section: Target Container Windowmentioning
confidence: 99%
“…The other specimen was shot-peened to introduce a compressive residual stress in the surface layer. These annealed and shot-peened specimens were the same specimens used in our previous study (6) . The distributions of the residual stress were measured by the surfaceremoval method combined with the conventional sin 2 ψ method.…”
Section: Materials and Specimensmentioning
confidence: 99%
“…9, the open circles indicate the residual stress measured by the strain scanning method. The solid circles indicate the residual stress obtained in our previous study (6) , where the surface layer of the shot-peened specimen was removed successively by electropolishing and the stress measurement by the sin 2 ψ method using Cr-Kα radiation was repeated. The value of the stress measured by sin 2 ψ method were corrected by taking account of the surface removal.…”
Section: Use Of Analyzer To Reduce the Surface Aberration Effectmentioning
confidence: 99%