Evaluation of spectral phase in spectrally resolved white-light interferometry: Comparative study of single-frame techniques

Abstract. We propose a low-coherence spectral-domain phase microscopy (SDPM) system for accurate quantitative phase measurements in red blood cells (RBCs) for the prognosis and monitoring of disease conditions that affect the visco-elastic properties of RBCs. Using the system, we performed time-recordings of cell membrane fluctuations, and compared the nano-scale fluctuation dynamics of healthy and glutaraldehyde-treated RBCs. Glutaraldehyde-treated RBCs possess lower amplitudes of fluctuations, reflecting an increased membrane stiffness. To demonstrate the ability of our system to measure fluctuations of lower amplitudes than those measured by the commonly used holographic phase microscopy techniques, we also constructed wide-field digital interferometry (WFDI) system and compared the performances of both systems. Due to its common-path geometry, the opticalpath-delay stability of SDPM was found to be less than 0.3 nm in liquid environment, at least three times better than WFDI under the same conditions. In addition, due to the compactness of SDPM and its inexpensive and robust design, the system possesses a high potential for clinical applications.

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“…17,[19][20][21] The intensity of the interference pattern on the spectrometer can be expressed as follows:…”

Section: Sdpm Principlesmentioning

confidence: 99%

Optical phase nanoscopy in red blood cells using low-coherence spectroscopy

et al. 2012

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“…Typically, white light interference fringes are modulated and associated with non-uniform illumination so we use a normalization technique to avoid phase error [40].…”

Section: Working Principlementioning

confidence: 99%

Single Shot White Light Interference Microscopy for 3D Surface Profilometry Using Single Chip Color Camera

Srivastava

Inam²,

Kumar³

et al. 2016

Journal of the Optical Society of Korea

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We present a single shot low coherence white light Hilbert phase microscopy (WL-HPM) for quantitative phase imaging of Si opto-electronic devices, i.e., Si integrated circuits (Si-ICs) and Si solar cells. White light interferograms were recorded by a color CCD camera and the interferogram is decomposed into the three colors red, green and blue. Spatial carrier frequency of the WL interferogram was increased sufficiently by means of introducing a tilt in the interferometer. Hilbert transform fringe analysis was used to reconstruct the phase map for red, green and blue colors from the single interferogram. 3D step height map of Si-ICs and Si solar cells was reconstructed at multiple wavelengths from a single interferogram. Experimental results were compared with Atomic Force Microscopy and they were found to be close to each other. The present technique is non-contact, full-field and fast for the determination of surface roughness variation and morphological features of the objects at multiple wavelengths.

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“…By fitting the extracted phase to a theoretical model, the thickness of SiO 2 thin film on a silicon wafer working as a reflecting mirror [34] and the effective thickness of a cube beamsplitter in the interferometer [35] were measured. A comparison of various techniques for phase extraction from spectrally resolved white-light interferometry, the FT, Hilbert transform, spatial phase-shifting, the WFF, and wavelet transform, were presented in [36].…”

Section: Wff2 For White-light Spectral Interferometrymentioning

confidence: 99%

Applications of windowed Fourier fringe analysis in optical measurement: A review

Kemao

2015

Optics and Lasers in Engineering

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Evaluation of spectral phase in spectrally resolved white-light interferometry: Comparative study of single-frame techniques

Cited by 55 publications

References 30 publications

Optical phase nanoscopy in red blood cells using low-coherence spectroscopy

Optical phase nanoscopy in red blood cells using low-coherence spectroscopy

Single Shot White Light Interference Microscopy for 3D Surface Profilometry Using Single Chip Color Camera

Applications of windowed Fourier fringe analysis in optical measurement: A review

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