This Letter reports on the use of a spatial phase-shifting algorithm in a fast, straightforward method of real-time quantitative phase imaging. The computation time for phase extraction is five times faster than a Fourier transform and twice as fast as a Hilbert transform. The fact that the phase extraction from an interferogram of 512 × 512 pixels takes less than 8.93 ms with a typical desktop computer suggests the proposed method can be readily applied to high-speed dynamic quantitative phase imaging. The proposed method of quantitative phase imaging is effective and sufficiently general for application to the dynamic phenomena of biological samples.

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We describe how spectrally-resolved white-light phase-shifting interference microscopy with a windowed 8-step algorithm can be used for rapid and accurate measurements of the thickness profile of transparent thin film layers with a wide range of thicknesses deposited upon patterned structures exhibiting steps and discontinuities. An advantage of this technique is that it can be implemented with readily available hardware.

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