2021
DOI: 10.1007/978-981-33-4597-3_78
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Evaluation of the Transfer Learning Models in Wafer Defects Classification

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Cited by 9 publications
(2 citation statements)
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“…Transfer learning provides a method to leverage pretrained CNNs on general image datasets and transfer the learned features to new tasks with limited data. As reported in the literature, the aforesaid technique has been successfully employed on different applications [4]- [9]. With regards to defect detection, Tabl et al [10] used a fine-tuned ResNet-50 CNN model to classify manufacturing defects as either normal or defective.…”
Section: Introductionmentioning
confidence: 99%
“…Transfer learning provides a method to leverage pretrained CNNs on general image datasets and transfer the learned features to new tasks with limited data. As reported in the literature, the aforesaid technique has been successfully employed on different applications [4]- [9]. With regards to defect detection, Tabl et al [10] used a fine-tuned ResNet-50 CNN model to classify manufacturing defects as either normal or defective.…”
Section: Introductionmentioning
confidence: 99%
“…It was shown from the study that the InceptionV3-RF pipeline demonstrates a test classification accuracy of 91%, in demarcating the normal and OSCC classes, suggesting that the proposed architecture has an attractive proposition. In this chapter, a feature-based transfer learning approach [7][8][9] by considering the VGG16 pretrained CNN model with its fully connected layers replaced by the SVM, kNN and RF classifiers in the classification of OSCC is investigated.…”
Section: Introductionmentioning
confidence: 99%