1996
DOI: 10.1116/1.588939
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Evidence for the occupation of DX centers in In0.29Al0.71As

Abstract: Articles you may be interested inOptimum channel thickness of Al0.3Ga0.7As/In0.25Ga0.75As/GaAs heterostructures for electron transport applications

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Cited by 3 publications
(2 citation statements)
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“…In Al 0.2 Ga 0.8 As where the DX center energy level is slightly above the conduction band minimum ͑CBM͒ ͑at xϭ0. Galvanomagnetic measure-a͒ Electronic mail: wieder@ece.ucsd.edu ments were used previously by ourselves and others [10][11][12][13] for investigating the composition dependence and other properties of Al x Ga 1Ϫx As and In x Al 1Ϫx As-based modulationdoped heterostructures containing DX centers. An alternative approach to raising E F is to lower E DX relative to the CBM by the application of hydrostatic pressure.…”
Section: Introductionmentioning
confidence: 99%
“…In Al 0.2 Ga 0.8 As where the DX center energy level is slightly above the conduction band minimum ͑CBM͒ ͑at xϭ0. Galvanomagnetic measure-a͒ Electronic mail: wieder@ece.ucsd.edu ments were used previously by ourselves and others [10][11][12][13] for investigating the composition dependence and other properties of Al x Ga 1Ϫx As and In x Al 1Ϫx As-based modulationdoped heterostructures containing DX centers. An alternative approach to raising E F is to lower E DX relative to the CBM by the application of hydrostatic pressure.…”
Section: Introductionmentioning
confidence: 99%
“…However, to date there is significantly less work on DX centers in InxAll.xAs compounds. Young and Wieder [9] measured the DX center energy level in In 0 . 48 As on InP and partly because the energy level of the DX center is in resonance with the conduction band in In 0 .…”
Section: Introductionmentioning
confidence: 99%