Evidence of failure at high temperatures by metal penetration in Al/sub 0.3/Ga/sub 0.22/In/sub 0.48/P/GaAs HBTs

Shu, W.M.; Gu, W.; Wu, J.; Xia, Guoqi; Houston, P.A.

doi:10.1109/icsict.1998.785961

1998 5th International Conference on Solid-State and Integrated Circuit Technology. Proceedings (Cat. No.98EX105)

DOI: 10.1109/icsict.1998.785961

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Evidence of failure at high temperatures by metal penetration in Al/sub 0.3/Ga/sub 0.22/In/sub 0.48/P/GaAs HBTs

W.M. Shu¹,

W. Gu²,

J. Wu³

et al.

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Evidence of failure at high temperatures by metal penetration in Al/sub 0.3/Ga/sub 0.22/In/sub 0.48/P/GaAs HBTs

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