2014
DOI: 10.1063/1.4866004
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Evidence of the metal-insulator transition in ultrathin unstrained V2O3 thin films

Abstract: We report the strain state and transport properties of V 2 O 3 layers and V 2 O 3 /Cr 2 O 3 bilayers deposited by molecular beam epitaxy on (0001)-Al 2 O 3 . By changing the layer on top of which V 2 O 3 is grown, we change the lattice parameters of ultrathin V 2 O 3 films significantly. We find that the metal-insulator transition is strongly attenuated in ultrathin V 2 O 3 layers grown coherently on Al 2 O 3 . This is in contrast with ultrathin V 2 O 3 layers grown on Cr 2 O 3 buffer layers, where the metal-i… Show more

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Cited by 58 publications
(52 citation statements)
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“…This is highlighted in Figure 1(b) which shows the ratio of the mean size of crystalline domains in the vertical direction to film thickness, as a function of temperature. Previously reported temperature values used for the fabrication of epitaxial V 2 O 3 are generally in the range of 700 • C. 3,7,[11][12][13][14] Our results however show that epitaxial V 2 O 3 films can be obtained using reactive dc-magnetron sputtering at deposition temperature values substantially lower than previously reported and without the need for post deposition annealing. 15 Figure 1(c) shows the location of the V 2 O 3 (0006) peak shifting toward lower values with increasing temperature crossing the bulk value of 38.514 • .…”
contrasting
confidence: 50%
See 1 more Smart Citation
“…This is highlighted in Figure 1(b) which shows the ratio of the mean size of crystalline domains in the vertical direction to film thickness, as a function of temperature. Previously reported temperature values used for the fabrication of epitaxial V 2 O 3 are generally in the range of 700 • C. 3,7,[11][12][13][14] Our results however show that epitaxial V 2 O 3 films can be obtained using reactive dc-magnetron sputtering at deposition temperature values substantially lower than previously reported and without the need for post deposition annealing. 15 Figure 1(c) shows the location of the V 2 O 3 (0006) peak shifting toward lower values with increasing temperature crossing the bulk value of 38.514 • .…”
contrasting
confidence: 50%
“…17,18 The peaks with Q x values corresponding to the substrate indicate that a fully strained interface layer is formed in the initial stages of deposition. 7,11 The intensity of these peaks reduces with increased O 2 flow rates.…”
mentioning
confidence: 98%
“…In figure 3(a) we present the resistivity as a function of temperature for a V 2 O 3 film. One can see that a typical MIT is observed for our V 2 O 3 films, which is similar to previous reports for V 2 O 3 [20,21]. The transition temperature (T MIT ) is determined from the derivative of ln(ρ) and plotted with respect to temperature, as shown in the inset of figure 3(a).…”
Section: Resultssupporting
confidence: 88%
“…However, an increase in H c of ~59% (from 92 Oe at 185 K to 146 Oe at 160 K) is observed in the bilayer while the change in the same temperature range for the Co film is of only ~15%. Interestingly, the deviation in H c is observed within a temperature range where the V 2 O 3 structural phase transition occurs (in this temperature range the V 2 O 3 layer exhibits a MIT, see figure 3(a)) [13,20]. On the other hand, the coercive field in the V 2 O 3 /Co bilayers is slightly larger for increasing than for decreasing temperature (see inset in figure 2(b)), which can be attributed to the typical thermal hysteresis observed for the structural phase transition in V 2 O 3 [12].…”
Section: Resultsmentioning
confidence: 98%
“…Unlike the electrical transport properties of the VO 2 (M1) or VO 2 (B) phase, the V 2 O 3 phase is a metal at room temperature and a semimetal at low temperatures (with hysteresis), which may be associated with the MIT. 37,38 The two mixed-phase systems VO 2 (mM + M1) and VO 2 (B + M1) thin lms also show a MIT, likely due to the dominations of M1 phases over the other phases. However, the MIT is subtle and obviously suppressed in comparison to the pure M1 phase.…”
mentioning
confidence: 99%