2016
DOI: 10.1007/s11664-016-5117-x
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Evolution of Metallic Conductivity in Epitaxial ZnO Thin Films on Systematic Al Doping

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Cited by 6 publications
(2 citation statements)
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“…All samples demonstrate a typical degenerate semiconductor behavior with the weak temperature dependence of the relatively low resistivity. All mixed-doped compositions and Zn0.997Al0.003O show an almost linear increase in resistivity on heating, in accordance with Bloch-Grüneisen model for typical metals [40,41], indicating predominant scattering of the charge carriers by the phonons. Indeed, the values of Debye temperature reported for undoped zinc oxide correspond to 400-440 K [42,43], while doping is expected to shift it to lower temperatures [41].…”
Section: Al Atoms At High Dopant Contentssupporting
confidence: 77%
“…All samples demonstrate a typical degenerate semiconductor behavior with the weak temperature dependence of the relatively low resistivity. All mixed-doped compositions and Zn0.997Al0.003O show an almost linear increase in resistivity on heating, in accordance with Bloch-Grüneisen model for typical metals [40,41], indicating predominant scattering of the charge carriers by the phonons. Indeed, the values of Debye temperature reported for undoped zinc oxide correspond to 400-440 K [42,43], while doping is expected to shift it to lower temperatures [41].…”
Section: Al Atoms At High Dopant Contentssupporting
confidence: 77%
“…The AZO-1.5 and AZO-1.9 films, which were approximately at the optimal doping level, had a larger difference between the N Hall~1 .27 × 10 21 cm −3 and N opt~3 .1 × 10 20 cm −3 . Chinta et al have also found the N Hall value from 4.86 × 10 19 to 2.99 × 10 20 cm −3 and the N opt value from 5.85 × 10 19 to 2.29 × 10 20 cm −3 for constant m* when the ZnO films were doped by Al from 0 to 10 at.% [43]. Figure 13c shows that the two µ opt values calculated using Equation 7and Table 2 were slightly lower because the free carriers scattered the charged donor impurity atoms more frequently under the electrostatic field.…”
Section: Spectroscopic Ellipsometry Studymentioning
confidence: 85%