Evolution of photoelectron spectra at thermal reduction of graphene oxide

Abstract

The dynamics of graphene oxide (GO) reduction process is investigated by the electron spectroscopy. GO samples were obtained by the standard Hummers method with the subsequent thermal treatment at different temperatures. Photoelectron emission spectra (PES) of C 1s core level and its energy loss range are analyzed using the invariant imbedding principle. The differential single scattering inelastic cross sections xin(Δ) of all the GO samples were derived by using the fitting procedure. Simulation of PES is performed by making use of the partial intensity approach. The cross sections dynamics analysis shows the reduction process of the graphene structure with increasing annealing temperature. Thermal treatment at a temperature of 600 °C results in the appearance of π-plasmon peak.

Percolation Conduction of Carbon Nanocomposites

“…The analysis of XPS spectra of partially reduced GO permits one to determine the change of electronic characteristics of the material in the process of its annealing [ 51 , 52 ]. The spectra of GO samples annealed at various temperatures were measured using the apparatus Kratos Axis Ultra DLD.…”

“…As a result of the percolation transition, the conductivity of a sample increases by several orders of magnitude, which is accompanied by the appearance of plasmon oscillations. Figure 16 presents the comparison of dependences of the plasmon peak intensity and the conductivity of reduced GO on the annealing temperature [ 51 ]. The similarity of these dependences indicates a physical correspondence of the reduced GO conductivity and the plasmon peak intensity.…”

“… Comparison of dependences of the relative intensity of the π—plasmon peak ( 1 ) and the conductivity ( 2 ) of reduced GO sample on the annealing temperature [ 51 ]. …”