2018
DOI: 10.1088/1742-6596/1121/1/012001
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Reduced graphene oxide studied by X-ray photoelectron spectroscopy: evolution of plasmon mode

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Cited by 3 publications
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“…The analysis of XPS spectra of partially reduced GO permits one to determine the change of electronic characteristics of the material in the process of its annealing [ 51 , 52 ]. The spectra of GO samples annealed at various temperatures were measured using the apparatus Kratos Axis Ultra DLD.…”
Section: Percolation Behavior Of Reduce Graphene Oxidementioning
confidence: 99%
“…The analysis of XPS spectra of partially reduced GO permits one to determine the change of electronic characteristics of the material in the process of its annealing [ 51 , 52 ]. The spectra of GO samples annealed at various temperatures were measured using the apparatus Kratos Axis Ultra DLD.…”
Section: Percolation Behavior Of Reduce Graphene Oxidementioning
confidence: 99%