2015
DOI: 10.1016/j.surfcoat.2014.11.020
|View full text |Cite
|
Sign up to set email alerts
|

Evolution of the functional properties of titanium–silver thin films for biomedical applications: Influence of in-vacuum annealing

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
2

Citation Types

5
23
0

Year Published

2015
2015
2022
2022

Publication Types

Select...
6

Relationship

3
3

Authors

Journals

citations
Cited by 21 publications
(28 citation statements)
references
References 53 publications
5
23
0
Order By: Relevance
“…This aspect is particularly relevant for the temperatures of 673 K and 773 K. At these temperatures, new diffraction peaks can be observed at 2θ$ 43.4°; 2θ$ 53.0°and 2θ$ 62.9°, corresponding to the formation of the Ti 2 Ag intermetallic phase, according to ICSD database (code 605935). Indeed and attending to previous works by the authors, such structural evolution was expectable given the Ag concentration in the films, 11 at%, as determined by RBS [1,2]. The influence of the temperature in the thermal stability of Ti-Ag intermetallic thin films was already evaluated [2], and a schematic model of the thermal structure evolution, suggested by the authors, is depicted in Fig.…”
Section: Resultsmentioning
confidence: 59%
See 4 more Smart Citations
“…This aspect is particularly relevant for the temperatures of 673 K and 773 K. At these temperatures, new diffraction peaks can be observed at 2θ$ 43.4°; 2θ$ 53.0°and 2θ$ 62.9°, corresponding to the formation of the Ti 2 Ag intermetallic phase, according to ICSD database (code 605935). Indeed and attending to previous works by the authors, such structural evolution was expectable given the Ag concentration in the films, 11 at%, as determined by RBS [1,2]. The influence of the temperature in the thermal stability of Ti-Ag intermetallic thin films was already evaluated [2], and a schematic model of the thermal structure evolution, suggested by the authors, is depicted in Fig.…”
Section: Resultsmentioning
confidence: 59%
“…The electrical resistivity of metallic thin films depends on a large number of parameters, closely linked with the chemical composition and the structural and morphological evolution [1,2,10,11,19]. Fig.…”
Section: Resultsmentioning
confidence: 99%
See 3 more Smart Citations