2020
DOI: 10.1016/j.jnucmat.2020.152051
|View full text |Cite
|
Sign up to set email alerts
|

Evolution of vacancy defects in heavy ion irradiated tungsten exposed to helium plasma

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2
1

Citation Types

0
14
0

Year Published

2020
2020
2023
2023

Publication Types

Select...
6
1

Relationship

0
7

Authors

Journals

citations
Cited by 24 publications
(14 citation statements)
references
References 57 publications
0
14
0
Order By: Relevance
“…The irradiation behavior of tungsten has been widely researched in recent years [9][10][11]. A series of important results are obtained.…”
Section: Introductionmentioning
confidence: 99%
“…The irradiation behavior of tungsten has been widely researched in recent years [9][10][11]. A series of important results are obtained.…”
Section: Introductionmentioning
confidence: 99%
“…Excessive H atoms and self‐interstitial W atoms generated via loop punching diffuse into the bulk layer and remain in defects such as dislocations and vacancies, which can reduce the capture rate of positrons and increase the annihilation probability of positrons with high‐momentum electrons, leading to a reduction in the S‐parameter of the bulk zone. [ 36,42 ]…”
Section: Resultsmentioning
confidence: 99%
“…In the bulk layer, the dislocation loops generated by He loop punching in pure W, which are pinned by K bubbles in the WK alloy, diffuse to the matrix and react with intrinsic vacancies in the samples, decreasing the concentration and volume of vacancy‐type defects, and leading to a reduction in the S‐parameter of PW‐800. [ 11,31,42 ]…”
Section: Resultsmentioning
confidence: 99%
“…The cross-sectional transmission electron microscope (JEM-2100F, JEOL) images were taken for both un-irradiated and irradiated samples (at 200 keV). The 50 ~70 nm thick TEM samples were prepared by using a focused ion beam milling (3D FEG, Quanta) [35][36][37] with 30 kV Ga-ions (7 nA ~50pA). Before the milling process, a protective layer of Pt was deposited to prevent ion damages.…”
Section: Film Characterizationsmentioning
confidence: 99%