2004
DOI: 10.1016/j.jmmm.2003.12.723
|View full text |Cite
|
Sign up to set email alerts
|

Exchange biasing in NiFe/FeMn/NiFe with Si seed and capping layers

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
2
0

Year Published

2011
2011
2022
2022

Publication Types

Select...
3
1

Relationship

0
4

Authors

Journals

citations
Cited by 4 publications
(2 citation statements)
references
References 4 publications
(3 reference statements)
0
2
0
Order By: Relevance
“…(c) Condition (b) was followed by post-deposition annealing in the field at 250 • C (T A ) for 1 h, then cooled to RT in the magnetic field. The use of Ta as a seed layer produces a strong (1 1 1) texture in the Co and IrMn layers [15]. The composition of the IrMn alloy target was 20 at.% Ir and 80 at.% Mn.…”
Section: Methodsmentioning
confidence: 99%
“…(c) Condition (b) was followed by post-deposition annealing in the field at 250 • C (T A ) for 1 h, then cooled to RT in the magnetic field. The use of Ta as a seed layer produces a strong (1 1 1) texture in the Co and IrMn layers [15]. The composition of the IrMn alloy target was 20 at.% Ir and 80 at.% Mn.…”
Section: Methodsmentioning
confidence: 99%
“…Consequently, the choice of ULs for the deposition of AF layer becomes crucial. Accordingly, different materials for AF layer as PtMn [3,8], FeMn [7,10,20,21], IrMn [4][5][6]9,[11][12][13][14][15][16][17][18][19]22,24,25] and different ULs [3][4][5][6][7][8][11][12][13][14][15][16][17][18]21,22] deposited using DC and RF magnetron sputtering (DC-MS, RF-MS) and ion beam sputtering [20] were established. In top EB systems, ULs as Ta/NiFe [6], Ta, Cu or Si [7,13,17,20], Cu, Ru or Cu/ Ru [4,5,15] provides the /1 1 1S texture in AF layer, in bottom type EB systems it was induced by Ta/AuCu [3]<...>…”
Section: Introductionmentioning
confidence: 99%