2013
DOI: 10.1016/j.apsusc.2013.05.018
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Excimer laser patterning of PEDOT:PSS thin-films on flexible barrier foils: A surface analysis study

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Cited by 7 publications
(4 citation statements)
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“…Also the Carbon (C) content has been reduced widely in the ablated area (bottom) as compared to non-ablated area (top), and the remaining carbon may correspond to impurities. A more detailed investigation can be carried out by using Time-of-Flight Static Secondary Ion Mass Spectroscopy (TOF-S-SIMS) [14], as an analytical method to analyze the outermost molecular surface layer of the ablated area after thin films removal from the substrate.…”
Section: Bpapf αNpb and Hdr014 Nanosecond Laser Patterningmentioning
confidence: 99%
“…Also the Carbon (C) content has been reduced widely in the ablated area (bottom) as compared to non-ablated area (top), and the remaining carbon may correspond to impurities. A more detailed investigation can be carried out by using Time-of-Flight Static Secondary Ion Mass Spectroscopy (TOF-S-SIMS) [14], as an analytical method to analyze the outermost molecular surface layer of the ablated area after thin films removal from the substrate.…”
Section: Bpapf αNpb and Hdr014 Nanosecond Laser Patterningmentioning
confidence: 99%
“…Gel permeation chromatography (GPC) or SEC, in this case, is not possible due to the negligible solubility in most common laboratory GPC compatible solvents and the high charge of the polymeric chain; nonetheless, only a few examples of mass spectrometry using MALDI techniques are available in the literature [ 94 , 95 ]. It is worthy to mention, that since the radical nuclear magnetic resonance is not possible on bare PEDOT, its molecular weight remains unclear.…”
Section: Introduction Of Conductive Polymersmentioning
confidence: 99%
“…Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is an appropriate analytical technique to study multilayer structures with high depth (1 nm) and lateral (< 100 nm) resolution. ToF-SIMS has been extensively used in organic electronics, over the years, in order to characterize OLEDs [13,14,15], OFETs [16], and organic solar cells [17,18]. More in general, secondary ion mass spectrometry is widely adopted to study surface modification [15,19,20] of semiconductor materials and devices through ToF-SIMS experiments in the so called "static mode".…”
Section: Introductionmentioning
confidence: 99%
“…ToF-SIMS has been extensively used in organic electronics, over the years, in order to characterize OLEDs [13,14,15], OFETs [16], and organic solar cells [17,18]. More in general, secondary ion mass spectrometry is widely adopted to study surface modification [15,19,20] of semiconductor materials and devices through ToF-SIMS experiments in the so called "static mode". In addition, decomposition [21], contamination [22], diffusion phenomena [13,22] in organic electronic devices are usually investigated with depth profiling experiments.…”
Section: Introductionmentioning
confidence: 99%