1998
DOI: 10.1103/physrevb.58.r13403
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Exciton formation and relaxation in GaAs epilayers

Abstract: Exciton formation and relaxation in GaAs bulk epilayers have been studied by means of time-resolved photoluminescence techniques. It is found that the time evolution of the free exciton luminescence, nonresonantly excited at low temperature and low intensity, is extremely slow, with a rise time of the order of 1 ns and a decay time of several ns. Simulations based on Monte Carlo solution of the set of coupled Boltzmann-like equations for free carriers and excitons show a nice agreement with the experimental da… Show more

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Cited by 39 publications
(19 citation statements)
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“…Time-resolved photoluminescence spectroscopy is widely used to investigate the kinetics of free exciton formation, relaxation, and recombination in semiconductors and their nanostructures [1]. In most experiments performed at low lattice temperatures a significantly delayed onset of the free exciton luminescence with respect to the excitation laser pulse is observed [2][3][4][5][6][7][8][9][10][11][12][13]. This slow photoluminescence (PL) rise has attracted intense research interest for nearly three decades.…”
mentioning
confidence: 99%
“…Time-resolved photoluminescence spectroscopy is widely used to investigate the kinetics of free exciton formation, relaxation, and recombination in semiconductors and their nanostructures [1]. In most experiments performed at low lattice temperatures a significantly delayed onset of the free exciton luminescence with respect to the excitation laser pulse is observed [2][3][4][5][6][7][8][9][10][11][12][13]. This slow photoluminescence (PL) rise has attracted intense research interest for nearly three decades.…”
mentioning
confidence: 99%
“…9 Thus, the literature provides a wide spectrum of experimental data with rise times increasing 10 or decreasing 7,8,[11][12][13] when raising the excitation density. On the other hand, in bulk III-V samples, these time-resolved studies are scarce [14][15][16][17] and ascertain that the free-exciton PL rise time is strongly influenced by trapping in localization centers.…”
Section: Introductionmentioning
confidence: 99%
“…Scaling this value to the 2D case one can get g 2D % 10 cm 2 s ± ±1 . Note that g 2D values in the range of 6 to 14 cm 2 s ± ±1 were extracted from the time-resolved study of exciton dynamics at high excitation levels [12,13]. Thus, the values obtained from the PMAE analysis of g and A are reasonable.…”
mentioning
confidence: 92%