2014
DOI: 10.1016/j.orgel.2014.10.017
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Experimental and numerical analysis of channel-length-dependent electrical properties in bottom-gate, bottom-contact organic thin-film transistors with Schottky contact

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Cited by 9 publications
(10 citation statements)
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“…The dependence of μ sat on the doping concentration shows a relatively similar trend to that of μ linear , while the saturation mobility becomes somewhat smaller than the linear mobility on the whole. If we can assume that the electron transport in the fabricated PCBM TFT follows the gate-voltage-dependent hopping conduction and is mainly governed by electron traps in the transistor channel, the electron depletion and concomitant electron detrapping can take place near the drain in the saturation regime (pinch-off phenomenon), which can reduce the electron mobility in the vicinity of the drain. This local charge/mobility distribution in the channel might give rise to smaller mobility values in the saturation regime.…”
Section: Results and Discussionmentioning
confidence: 99%
“…The dependence of μ sat on the doping concentration shows a relatively similar trend to that of μ linear , while the saturation mobility becomes somewhat smaller than the linear mobility on the whole. If we can assume that the electron transport in the fabricated PCBM TFT follows the gate-voltage-dependent hopping conduction and is mainly governed by electron traps in the transistor channel, the electron depletion and concomitant electron detrapping can take place near the drain in the saturation regime (pinch-off phenomenon), which can reduce the electron mobility in the vicinity of the drain. This local charge/mobility distribution in the channel might give rise to smaller mobility values in the saturation regime.…”
Section: Results and Discussionmentioning
confidence: 99%
“…We explain Thin-film Organic Transistor Advanced Simulator (TOTAS) [15][16][17][18] continuity (E is the electric field, ρ is the charge density, and the recombination ratio is assumed to be zero).…”
Section: Simulatormentioning
confidence: 99%
“…As a carrier injection model considering a Schottky barrier on an electrode/semiconductor interface, thermionic field emission (TFE) and thermionic emission (TE) are applied on source and drain electrodes, respectively [18]. It is noted that a semiconductor layer is treated as p-type one in this study, but TOTAS can also apply to n-type one.…”
Section: Simulatormentioning
confidence: 99%
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