2002
DOI: 10.1088/0741-3335/44/12/305
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Experimental characterization of hot electron production under femtosecond laser plasma interaction at moderate intensities

Abstract: We discuss methods and algorithms of high-temperature laser plasma electron diagnostics based on hard x-ray yield and ionic time-of-flight (TOF) spectra measurements in comparison with the results of direct electronic spectrum recording, with the help of the electrostatic spectrometer. The latter shows clearly the two-component nature of the electron population, arising at femtosecond laser plasma interaction. 'Temperatures' of 200 eV and 6 keV for thermal and hot electronic components, correspondingly, were e… Show more

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Cited by 33 publications
(20 citation statements)
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“…Combinations of different filters allowed assessing the mean hot-electron energy E hot in each laser shot. 33 All the detectors were calibrated absolutely.…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…Combinations of different filters allowed assessing the mean hot-electron energy E hot in each laser shot. 33 All the detectors were calibrated absolutely.…”
Section: Methodsmentioning
confidence: 99%
“…33. The special filter sets (Be(0.2 mm)/ Al(0.5 mm) and Be(0.2 mm)/Al(0.5 mm)/Ta(26 lm) for the respective first and second detection channels) were used in this study to avoid contribution of the Ga line emission to the steep slope of the hard x-ray spectrum above 11 keV.…”
Section: -2mentioning
confidence: 99%
“…where E is the photon energy, α is a generalized plasma parameter, and T h is the temperature of hotelectrons [6]. When X-ray radiation is generated only by Bremsstrahlung, the measured energy of the X-rays with the photo-diodes w PD is proportional to …”
Section: Focal Positionmentioning
confidence: 99%
“…The mean energy of hot electrons in the generated plasma was measured in each pulse by the two-detector filter method [6,7] from its X-radiation by means of two photoelectric multipliers with 5-mm-thick NaI scintillators and was found to be 13±2 keV on average. After each laser pulse, the target was shifted so that the radiation interacted with a smooth surface rather than with the crater remaining after the previous shot.…”
mentioning
confidence: 99%
“…The angle of incidence of ions onto the second target was about 45°. Electrons knocked out from this target passed through deflecting plates of an electrostatic semi cylindrical spectrometer [7], whose entrance window (2 × 0.5 cm) was situated at a distance of 4 cm from the second target, approximately along the perpendicular to its surface. These electrons were detected by a chevron microchannel plate.…”
mentioning
confidence: 99%