2013
DOI: 10.1016/j.jcrysgro.2012.12.001
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Experimental determination of adatom diffusion lengths for growth of InAs nanowires

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Cited by 45 publications
(78 citation statements)
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References 37 publications
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“…A weak interdot tunnel coupling compared to the tunnel rates to the leads, 12 1 , 2 , suggests that the transmission through the DQD is limited by 12 and the individual QDs can be assumed to be either filled or empty. This picture is illustrated in Fig.…”
Section: Double Dot Mr and Mrsmentioning
confidence: 99%
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“…A weak interdot tunnel coupling compared to the tunnel rates to the leads, 12 1 , 2 , suggests that the transmission through the DQD is limited by 12 and the individual QDs can be assumed to be either filled or empty. This picture is illustrated in Fig.…”
Section: Double Dot Mr and Mrsmentioning
confidence: 99%
“…It consists of a ∼80 nm diameter InAs NW deposited by spin coating on a Si ++ /SiO 2 substrate and contacted by source (S) and drain (D) Ti/Au (5 nm/70 nm) contacts. The NWs were grown by solid-source molecular beam epitaxy [12] implementing a two-step growth process to suppress stacking faults [13]. We used standard lock-in techniques to measure the differential conductance G = dI/dV as a function of the bias V at a base temperature of 230 mK in a 3 He cryostat.…”
Section: Introductionmentioning
confidence: 99%
“…Detailed discussion on growth parameters and procedures were explained elsewhere. 25 Conventional TEM experiments were performed in a FEI Titan 80-300 S/TEM operated at 300 kV. Atomic resolution high-angle annular dark-field (HAADF) Z-contrast imaging and high resolution X-ray energy-dispersive spectroscopy (EDS)/spectroscopic imaging by X-rays (SIX) experiments were carried out using an advanced probe Cs-corrected analytical TEM/STEM system JEM-ARM 200CF with cold field-emission gun (C-FEG) operated at 200 kV.…”
mentioning
confidence: 99%
“…Maintaining a Ga concentration corresponding to x $ 0.35 in each Ga x In 1Àx As segment ensures a high fraction of straight axially grown nanowires. 24,25 The wires predominantly exhibits the hexagonal wurtzite (WZ) structure and the preferential growth direction is along the hexagonal closed packed [0001] WZ as inferred from electron diffraction data shown in Figure 2(b). 23,[26][27][28] Our analysis of the multiple Ga Ga x In 1Àx As/InAs interface in Z-contrast HAADF-STEM imaging as shown in Figure 1(b).…”
mentioning
confidence: 99%
“…The NWs attain the wurtzite crystal structure with the [0001] direction along the NW axis and grow to a length of ~7 µm with a tapered profile having diameters of ~130 nm at the base and 40 nm at the tip 18 .…”
mentioning
confidence: 99%