The formalism of the N-beam dynamical theory of X-ray diffraction is extended to include all possible incident and diffracted polarizations. With this new formalism it is shown that the intensity of a simultaneously excited Bragg reflection can be described through a polarization density matrix that involves the Stokes-Poincar6 parameters. In particular, the multibeam diffracted intensity is sensitive to the circularly polarized component in the incident beam and the structure-factor phases of the diffracting crystal. Experimental results on the GaAs 442 and Ge 333 reflections confirm the theoretical calculations.
© 1993 International Union of Crystallography Printed in Great Britain -all rights reservedThis kind of measurement can provide useful acentric phase information and can also be used for circular X-ray polarimetry. Another feature of N-beam diffraction is its ability to turn a linear polarization into an elliptical polarization, which means it can be used as an X-ray phase plate.
IntroductionX-ray polarization plays an important role in every scattering and diffraction experiment. In crystallography, one needs to use the polarization-factor correction in order to obtain structure factors from diffracted intensities (Warren, 1969). In X-ray physics and Acta Crystallographica Section A ISSN 0108-7673 ©1993 606 X-RAY POLARIZATION IN MULTIPLE-BEAM BRAGG DIFFRACTION material science, polarization analysis can often reveal interesting features of the magnetic properties and atomic-site symmetries of the diffracting material (Templeton & Templeton, 1985;Blume & Gibbs, 1988;Belyakov & Dmitrienko, 1989;Kirfel, Petcov & Eichhorn, 1991;Finkelstein, Shen & Shastri, 1992). The increasingly available energy and polarization tunabilities of many intense synchrotron sources promise to provide experimenters with an extra dimension in the analysis of X-ray polarization in future diffraction experiments. It is, therefore, worthwhile to re-examine and extend some of the well established fields in X-ray diffraction. One such field is that of multiple-beam Bragg diffraction.Because of the co-existing effects of multibeam interference and polarization mixing (Shen, 1991), some new and interesting features in multibeam diffraction can emerge if one includes general elliptically polarized X-rays in the incident beam. These new features include phase determination on noncentrosymmetric crystals (Shen & Finkelstein, 1990), complete characterization of an elliptical polarization of an X-ray beam and utilization of multibeam diffraction as an X-ray circular phase plate.Multiple-beam diffraction occurs in a crystal when two or more atomic planes satisfy the Bragg conditions simultaneously. The process usually gives rise to a secondary peak (Renninger peak) in the intensity of a Bragg reflection, H, when the diffraction crystal is rotated around the scattering vector H (Renninger, 1937;Cole, Chambers & Dunn, 1962). The reflection H is usually termed the main reflection and the rotation is described by an azimuthal angle, ~o...