Experimental investigation of Gaussian random phase screen model for x-ray diffusers

Falch, Ken Vidar; Detlefs, C.; Christensen, Magnus Sebastian; Paganin, David M.; Mathiesen, Ragnvald H.

doi:10.1364/oe.27.020311

Cited by 3 publications

(1 citation statement)

References 22 publications

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“…The apparent absence of this noise in DFXM images is surprising at first. However, as previously observed, this noise is averaged out when the imaged field is only partially coherent (Falch et al, 2019;Carlsen et al, 2022). Normally we think of the dynamically scattered X-rays as highly coherent as the Bragg scattering effectively collimates the incident radiation, but this argument does not consider the polychromaticity of the incident radiation.…”

Section: Aberrated Lensesmentioning

confidence: 91%

Simulating dark-field X-ray microscopy images with wavefront propagation techniques

Carlsen¹,

Detlefs²,

Yildirim³

et al. 2022

Acta Cryst Sect A

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Dark-field X-ray microscopy is a diffraction-based synchrotron imaging technique capable of imaging defects in the bulk of extended crystalline samples. Numerical simulations are presented of image formation in such a microscope using numerical integration of the dynamical Takagi–Taupin equations and wavefront propagation. The approach is validated by comparing simulated images with experimental data from a near-perfect single crystal of diamond containing a single stacking-fault defect in the illuminated volume.

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Section: Aberrated Lensesmentioning

confidence: 91%

Simulating dark-field X-ray microscopy images with wavefront propagation techniques

Carlsen¹,

Detlefs²,

Yildirim³

et al. 2022

Acta Cryst Sect A

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Fourier ptychographic dark field x-ray microscopy

et al. 2022

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Dark-field x-ray microscopy (DFXM) is an x-ray imaging technique for mapping three-dimensional (3D) lattice strain and rotation in bulk crystalline materials. At present, these maps of local structural distortions are derived from the raw intensity images using an incoherent analysis framework. In this work, we describe a coherent, Fourier ptychographic approach that requires little change in terms of instrumentation and acquisition strategy, and may be implemented on existing DFXM instruments. We demonstrate the method experimentally and are able to achieve quantitative phase reconstructions of thin film samples and maps of the aberrations in the objective lens. The method holds particular promise for the characterization of crystalline materials containing weak structural contrast.

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Compact full-field hard x-ray microscope based on advanced Kirkpatrick–Baez mirrors

Yamada

Matsuyama

Hirose

et al. 2020

Optica

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X-ray full-field microscopy is a promising method for nondestructive observation of opaque materials because it can attain a high resolution and wide field of view without sample scanning. We recently developed hard x-ray objective optics, which are key devices for full-field microscopy, based on total-reflection mirrors with high throughput and achromatic properties. The objective optics consist of two types of advanced Kirkpatrick–Baez mirrors configured as crossed one-dimensional Wolter type I and type III optics. The designed optics possessed magnification factors of 42–45 with a compact camera length of approximately 2 m. The hard x-ray full-field microscope based on this system was tested at the BL29XU beamline at SPring-8. We were able to resolve 100-nm periods (50-nm line widths) of a resolution test chart at a photon energy of 15 keV over 30 h, which demonstrated the remarkable stability of this system. The image quality was preserved over a wide photon energy range from 9 to 15 keV. A periodic dot pattern with dot diameters of 300 nm, formed on a 775-µm-thick Si substrate, was three-dimensionally visualized by computed tomography.

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Experimental investigation of Gaussian random phase screen model for x-ray diffusers

Cited by 3 publications

References 22 publications

Simulating dark-field X-ray microscopy images with wavefront propagation techniques

Simulating dark-field X-ray microscopy images with wavefront propagation techniques

Fourier ptychographic dark field x-ray microscopy

Compact full-field hard x-ray microscope based on advanced Kirkpatrick–Baez mirrors

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