Experimental Investigation of SELs in SiT8003 MEMS-Oscillators

Tararaksin, Alexander S.; Kessarinskiy, Leonid N.; Pechenkin, Alexander; Demidova, Alexandra V.; Yanenko, Andrey V.; Boychenko, Dmitry V.; Nikiforov, Alexander Y.

doi:10.1109/redw.2015.7336709

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Experimental Investigation of SELs in SiT8003 MEMS-Oscillators

Cited by 6 publications

References 20 publications

The radiation test based assessment of process quality and reliability for conventional 65-nm CMOS technology

The radiation test based assessment of process quality and reliability for conventional 65-nm CMOS technology

Total Ionizing Dose Degradation of CMOS 8-transistor Image Sensor with Column ADC

The prediction for single event latchup sensitivity parameters of digital CMOS ICs based on its technological features

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