2020
DOI: 10.1016/j.nima.2020.164611
|View full text |Cite
|
Sign up to set email alerts
|

Experimental Study of Acceptor Removal in UFSD

Help me understand this report
View preprint versions

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

1
11
0

Year Published

2021
2021
2023
2023

Publication Types

Select...
6
2

Relationship

2
6

Authors

Journals

citations
Cited by 13 publications
(12 citation statements)
references
References 13 publications
1
11
0
Order By: Relevance
“…As a result, we show that the probe station can be used as a fast and reliable way to establish sensor quality control during the production phase of the CMS and ATLAS timing detectors. A similar correspondence between the gain layer depletion voltage and the operating voltage has been established for wide variation between distinct sensor designs [7]. In contrast, the results shown here probe this relationship with a larger sensor population, and focus on variation within the manufacturing tolerance for the context of production quality control.…”
supporting
confidence: 78%
“…As a result, we show that the probe station can be used as a fast and reliable way to establish sensor quality control during the production phase of the CMS and ATLAS timing detectors. A similar correspondence between the gain layer depletion voltage and the operating voltage has been established for wide variation between distinct sensor designs [7]. In contrast, the results shown here probe this relationship with a larger sensor population, and focus on variation within the manufacturing tolerance for the context of production quality control.…”
supporting
confidence: 78%
“…The two intercepts of the linear fits to the data in the three regions provide the gain layer depletion voltage V gl and the full bulk depletion voltage V fd . Changes in gain layer depletion have previously been shown to correlate with charge collection performance [10].…”
Section: Measurementsmentioning
confidence: 99%
“…12. Correlation between the bias for gain G=8, V(G=8), and the depletion voltage of the gain layer (V GL ) for three tested sensors [22].…”
Section: Radiation Hardness Overview Of Lgadsmentioning
confidence: 99%
“…The performance of the LGADs after irradiation with neutrons and protons is compromised by the removal of acceptors in the thin layer below the junction responsible for the gain [21]. This effect was tested both with capacitance-voltage measurements of the doping concentration and with measurements of charge collection using charged particles [22]. A perfect linear correlation between the bias voltage to deplete the gain layer determined with C-V and the bias voltage to collect a defined charge, measured with charge collection, was found.…”
Section: Radiation Hardness Overview Of Lgadsmentioning
confidence: 99%