2021
DOI: 10.1017/s1551929520001595
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Exploring Coupled Extreme Environments via In-situ Transmission Electron Microscopy

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Cited by 16 publications
(6 citation statements)
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“…Moving beyond traditional static characterization approaches toward in situ methods will allow us to capture the initial onset and evolution of local defects. In situ (scanning) transmission electron microscopy ((S)­TEM) has been widely employed by the radiation effects community to examine defects in materials, providing an invaluable window into irradiation-induced disorder, particularly in the low dose regime. These methods have long been used to examine bulk ceramics, , revealing radiation-induced defect formation pathways and kinetics.…”
Section: Introductionmentioning
confidence: 99%
“…Moving beyond traditional static characterization approaches toward in situ methods will allow us to capture the initial onset and evolution of local defects. In situ (scanning) transmission electron microscopy ((S)­TEM) has been widely employed by the radiation effects community to examine defects in materials, providing an invaluable window into irradiation-induced disorder, particularly in the low dose regime. These methods have long been used to examine bulk ceramics, , revealing radiation-induced defect formation pathways and kinetics.…”
Section: Introductionmentioning
confidence: 99%
“…In situ or operando techniques, where properties are monitored real time, provide a platform to characterize and understand the detailed evolution of materials in extreme environments. [51][52][53] Although advancements such as the combined irradiation and corrosion experiments are valuable, they still primarily rely upon postmortem characterization for quantifying materials evolution. In situ capabilities that directly observe these changes can provide a wealth of complementary information, particularly about kinetic properties.…”
Section: Beyond High-throughput: Autonomous Approachesmentioning
confidence: 99%
“…Additionally, advanced analytical microscopy tools have been deployed recently on multibeam irradiation facilities to probe the chemistry and structure of materials through Electron Energy Loss Spectroscopy (EELS), Energy Filtered-TEM (EF-TEM), Scanning Transmission Electron Microscopy (STEM), Energy Dispersive x-ray Spectroscopy (EDXS) 64 and Automated Crystal Orientation Mapping (ACOM). 65 In addition to electrons, positrons are also used to investigate defect evolution within materials through positron annihilation spectroscopy (PAS or PALS). Capabilities for in situ positron doppler broadening for investigating defect evolution of bulk materials under irradiation have been developed.…”
Section: Electron and Positron Beam Characterization Techniquesmentioning
confidence: 99%