2014
DOI: 10.1016/j.carbon.2013.12.018
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Exploring graphene formation on the C-terminated face of SiC by structural, chemical and electrical methods

Abstract: 2 the growth conditions used in this study, 5 monolayer thick graphene does not form a continuous layer, so such thickness is not sufficient to completely cover the substrate.

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Cited by 27 publications
(26 citation statements)
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“…One class is based on bulk compounds of graphite, which are well-known and diverse; here, the intercalant occupies the galleries between carbon sheets [195][196][197][198]. The other is based on supported graphene [16], where the intercalant is at or near the graphene-support interface, often modifying the electronic properties of the graphene blanket while leaving its structural integrity intact.…”
Section: Intercalation For Supported Graphene Systems and For Graphitementioning
confidence: 99%
“…One class is based on bulk compounds of graphite, which are well-known and diverse; here, the intercalant occupies the galleries between carbon sheets [195][196][197][198]. The other is based on supported graphene [16], where the intercalant is at or near the graphene-support interface, often modifying the electronic properties of the graphene blanket while leaving its structural integrity intact.…”
Section: Intercalation For Supported Graphene Systems and For Graphitementioning
confidence: 99%
“…The surface potential, chemical composition, and morphology of graphene grown on the C face of 4H-SiC have been explored [140]. By matching the same nanoscale features on the surface potential and Raman spectroscopy maps (Figure 29), individual domains and bare SiC substrate have been assigned to graphene patches one to five monolayers thick.…”
Section: Growth Of Graphene On C Facementioning
confidence: 99%
“…An important issue is the slight shift of the π * peak toward lower energies in the amorphous region, which could indicate defect states or chemical bonding with other species. Previous studies have claimed the presence of oxygen at the graphene/SiC(0001) system [5,31]. In order to verify this hypothesis, we controlled for an O-K edge signal during EELS acquisition, which showed the presence of a very low oxygen concentration confined within the amorphous region.…”
Section: Chemical Analysis and Electronic Structurementioning
confidence: 99%