2020
DOI: 10.1007/s11090-020-10113-y
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Exploring the Effects of Placement and Electron Angular Distribution on Two Adjacent Mask Holes During Plasma Etching Process

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Cited by 12 publications
(9 citation statements)
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“…图10中也分别给出 中和过剩的正电荷的方法 [3,92] . 该方法也被模拟证 实可以有效改善刻蚀效果 [93,94] . 应 [95,96] 等凸显, 导致等离子体密度在径向上变得 极其不均匀, 最终影响刻蚀工艺的质量 [95,97−101] .…”
Section: 在近期对真实的能量依赖的二次电子发射的 研究中 研究者发现极板上大量的二次电子发射同unclassified
“…图10中也分别给出 中和过剩的正电荷的方法 [3,92] . 该方法也被模拟证 实可以有效改善刻蚀效果 [93,94] . 应 [95,96] 等凸显, 导致等离子体密度在径向上变得 极其不均匀, 最终影响刻蚀工艺的质量 [95,97−101] .…”
Section: 在近期对真实的能量依赖的二次电子发射的 研究中 研究者发现极板上大量的二次电子发射同unclassified
“…The main reaction paths and concentration of active species were observed. Zhang et al [20] developed a chemical kinetic mechanism of ignition enhancement and concluded that methane combustion has a great influence on the O atom and exciting species. Besides this, Kim et al [21] studied the premixed methane/air plasma combustion by considering the excited species of oxygen and nitrogen.…”
Section: Introductionmentioning
confidence: 99%
“…Moreover, the mask can charge up negatively in the presence of a wide angular distribution of the electron velocities at the wafer. This can lead to an attraction of positive ions, which causes mask distortion [20,21]. These issues represent significant limitations of modern HAR plasma etching and lead to a continuous increase of driving voltages to ensure even higher ion energies to overcome retarding potentials inside etch features.…”
Section: Introductionmentioning
confidence: 99%
“…This approach, however, only treats the symptoms of a problem, whose origin can be removed by ensuring in-feature surface charge neutralization. This requires the generation of a significant flux of electrons with high velocities directed normal to the electrode [20,21]. This would also reduce the negative charge-up of the mask.…”
Section: Introductionmentioning
confidence: 99%