We present a new nonorthogonal sp 3 tight binding model to study the band offsets of widegap heterostructures as a function of interface strain due to external pressure and lattice mismatch and thermal expansion gradient. As examples we discuss the GaN and ZnSe based heterostructures, because their properties are important for optoelectronic applications. Good agreement is found between theory and experiment for valence band offsets of various heterostructures at T ¼ 300 K.Introduction Group III-V and II-VI compounds such as GaN and ZnSe and their ternary alloys have emerged as some of the most promising semiconductors for optoelectronics and high temperature electronics. Especially ZnSe/GaAs, AlGaN/GaN, and InGaN/GaN heterostructures have been the subject of considerable attention because their properties are important for optoelectronic technology. The key property to understand the impact of these heterostructures on the device performance is the interface band structure. The spike DE c in the conduction band and step DE v in the valence band influences the carrier injection and current transport in heterojunction devices and their reliable and precise modelling is highly important [1,2]. In this work, we introduce a nonorthogonal sp 3 tight binding model to study band offsets of widegap hetrostructures with zinc blende structures as a function of interface strain due to external pressure, lattice mismatch and thermal expansion gradient.