Extracting electron backscattering coefficients from backscattered electron micrographs

Zupanič, Franc

doi:10.1016/j.matchar.2010.09.004

Cited by 17 publications

(7 citation statements)

References 9 publications

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“…Spatially resolved XRD analysis indicated Li 7 Si 3 had a slight unit cell expansion (0.8%), but the source of the expansion has not been determined. More detailed work on this behaviour is warranted, such as the estimation of lithium content as a function of BSE intensity using a number of standard samples in the manner of Zupanic (2010).…”

Section: Application: Metallographic Analysis Of a Thermal Battery Cellsupporting

confidence: 85%

Low-hazard metallography of moisture-sensitive electrochemical cells

Wesolowski

Rodriguez

McKenzie

et al. 2011

Journal of Microscopy

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Summary A low‐hazard approach is presented to prepare metallographic cross‐sections of moisture‐sensitive battery components. The approach is tailored for evaluation of thermal (molten salt) batteries composed of thin pressed‐powder pellets, but has general applicability to other battery electrochemistries. Solution‐cast polystyrene is used to encapsulate cells before embedding in epoxy. Nonaqueous grinding and polishing are performed in an industrial dry room to increase throughput. Lapping oil is used as a lubricant throughout grinding. Hexane is used as the solvent throughout processing; occupational exposure levels are well below the limits. Light optical and scanning electron microscopy on cross‐sections are used to analyse a thermal battery cell. Spatially resolved X‐ray diffraction on oblique angle cut cells complement the metallographic analysis.

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Section: Application: Metallographic Analysis Of a Thermal Battery Cellsupporting

confidence: 85%

Low-hazard metallography of moisture-sensitive electrochemical cells

Wesolowski

Rodriguez

McKenzie

et al. 2011

Journal of Microscopy

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“…These phases are much darker than would be expected according to their chemical composition obtained using EDS because when using EDS, only the contents of Al, Mn and Cu could be determined [10]. It was discovered that in all Be-rich particles, the sums of Cu-and Mn-content as atomic percentages were equal to the Al-contents.…”

Section: Slow-coolingmentioning

confidence: 95%

“…Each alloy contained several phases. The phases labelled in the micrographs were identified using Z-contrast analysis [10], XRD (Fig. 2), EDS-results and Tof SIMS (Fig.…”

Section: Microstructural Evolution In Al-mn-cu-(be) Alloysmentioning

confidence: 99%

Microstructural evolution in Al–Mn–Cu–(Be) alloys

Rozman

Medved

Zupanič

2011

Philosophical Magazine

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“…It is clear that η does not have the energy resolution of EDX, however, in contrast to EDX it reflects the impact of all material constituents, i.e., also light elements which are invisible for EDX detectors. Examples are given in . Moreover, the BSE signal has a higher spatial resolution than EDX.…”

Section: Imaging By Using the Ebsd Signalmentioning

confidence: 99%

Electron backscatter diffraction beyond the mainstream

Nolze

Hielscher

Winkelmann

2016

Crystal Research and Technology

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We present special applications of electron backscatter diffraction (EBSD) which aim to overcome some of the limitations of this technique as it is currently applied in the scanning electron microscope. We stress that the raw EBSD signal carries additional information which is useful beyond the conventional orientation determination. The background signal underlying the backscattered Kikuchi diffraction (BKD) patterns reflects the chemical composition and surface topography but also contains channeling-in information which is used for qualitative real-time orientation imaging using various backscattered electron signals. A significantly improved orientation precision can be achieved when dynamically simulated pattern are matched to the experimental BKD patterns. The breaking of Friedel's rule makes it possible to obtain orientation mappings with respect to the point-group symmetries. Finally, we discuss the determination of lattice parameters from individual BKD patterns. Subgrain structure in a single quartz grain. The increased noise level in the left map reflects the lower precision of a standard orientation determination using band detection by the Hough transform. The right map results from the same experimental raw data after orientation refinement using a pattern matching approach. The colors correspond an adapted inverse pole figure color key with a maximum angular deviation of about 2 • from the mean orientation.

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Extracting electron backscattering coefficients from backscattered electron micrographs

Cited by 17 publications

References 9 publications

Low-hazard metallography of moisture-sensitive electrochemical cells

Low-hazard metallography of moisture-sensitive electrochemical cells

Microstructural evolution in Al–Mn–Cu–(Be) alloys

Electron backscatter diffraction beyond the mainstream

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