AIP Conference Proceedings 2009
DOI: 10.1063/1.3140549
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Extraction and Analysis of Noise Parameters of On Wafer HEMTs up to 26.5 GHz

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Cited by 2 publications
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“…5): an extrinsic part consisting of elements assumed to be bias independent and an intrinsic part consisting of bias dependent elements. To reproduce also the noise FET properties, an equivalent temperature is associated to each resistor [7,8].…”
Section: Model Extractionmentioning
confidence: 99%
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“…5): an extrinsic part consisting of elements assumed to be bias independent and an intrinsic part consisting of bias dependent elements. To reproduce also the noise FET properties, an equivalent temperature is associated to each resistor [7,8].…”
Section: Model Extractionmentioning
confidence: 99%
“…Determination and validation of an accurate microwave small signal and noise model for microwave solid state devices is mandatory for optimizing the design of reliable low-noise amplifiers operating in the microwave frequency range [1][2][3][4][5][6][7][8][9][10][11][12]. For that reason, we report here on measurements of scattering (S-) parameter and 50 X noise figure, respectively up to 50 GHz and 26.5 GHz, for on wafer AlGaAs/GaAs HEMTs with different gate width.…”
Section: Introductionmentioning
confidence: 99%
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