1972
DOI: 10.1016/0039-9140(72)80225-x
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Extreme trace analysis of the elements—IMethods and problems of sample treatment, separation and enrichment

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Cited by 121 publications
(11 citation statements)
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“…The method used by us has the advantage of low losses [4,6,7,23]. With elements in very low concentrations there is a risk of contamination [29,43]. Singje determinations of the metals in the reference material demonstrate that the entire analytic sequence has a large scatter.…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…The method used by us has the advantage of low losses [4,6,7,23]. With elements in very low concentrations there is a risk of contamination [29,43]. Singje determinations of the metals in the reference material demonstrate that the entire analytic sequence has a large scatter.…”
Section: Methodsmentioning
confidence: 99%
“…This is evident from the blank values. Methodical and statistieal errors may yield a measurement even if the element in question is not even present in the material [41,43]. For the chromium determination the blank values were log-normally distributed.…”
Section: Methodsmentioning
confidence: 99%
“…In addition, a study by Benes et al demonstrated that the extent of sorption losses varies from ion to ion (16). Several groups recommend the use of acid washed vessels, nonsorbing materials, and the fewest possible sample manipulations to minimize losses and contaminations in trace metal ion analyses (17)(18)(19).…”
Section: Acknowledgmentmentioning
confidence: 99%
“…We have used 3san,, as an estimate of the detection limit (Strickland and Parsons 1965;Tolg 1972). We have used 3san,, as an estimate of the detection limit (Strickland and Parsons 1965;Tolg 1972).…”
Section: Analytical Error-precision and Detectionmentioning
confidence: 99%