“…Experimentally, the SS in topological insulators can be determined by Scanning Tunneling Microscopy (STM) and Angle-Resolved Photoemission Spectroscopy (ARPES) [5,17,18]. Numerous bismuth (Bi)-based materials such as Bi 1−x Sb x , Bi 2 Te 3, and Bi 2 Se 3 have been experimentally verified to possess these topological SS [19,20], and their existence in these 3D binaries TIs has been verified through magneto-transport measurements in thin films [21], and single crystals [22]. The surface states of these topological insulators, i.e., Bi 2 Te 3 and Bi 2 Se 3, are verified to possess only one helical Dirac cone [4,5,18], and WAL is intrinsic to them.…”