Fabrication and characterization of indium tin oxide (ITO)/polycrystalline silicon solar cells

Cheek, G.; Inoue, Narumi; Goodnick, Stephen M.; Genis, A. P.; Wilmsen, C. W.; DuBow, J.

doi:10.1063/1.90448

Cited by 39 publications

(6 citation statements)

References 8 publications

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“…It also revealed that, reduction of output of polycrystalline cells is not directly depends on grain boundaries as their area of impact is low compared to total area. In contrary, a notable reduction in photocurrent and barrier height can be caused by the background defects (Cheek et al, 1978).…”

Section: Research Work On Schottky Solar Cell In Chronological Ordermentioning

confidence: 97%

“…The following table gives some clear idea about the materials of the top layer. Though these are the possible materials those can be used in MIS/SIS cells but mainly ZnO [18] , AZO (Fuchsel;Jia et al, 2013;Bethge), ITO (Cheek et al, 1978;Ashok et al, 1980;Saha et al, 1983;Saim et al, 1987;Simashkevich et al, 2004;Malik et al, 2008;Bruk et al, 2009;Liu et al, 2010;Du et al, 2015;Du et al, 2017) are used by most of the researchers. Another material which is very popular for n-type base material is Graphene (Li et al, 2010;Feng et al, 2012;Miao et al, 2012;Liu et al, 2015;Song et al, 2015).…”

Section: Suitable Materials For Top Layermentioning

confidence: 99%

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Advancement of Schottky Barrier Solar Cells: A Review

Chowdhury¹,

Mandal²

2020

Contemporary Issues in Computing

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Section: Research Work On Schottky Solar Cell In Chronological Ordermentioning

confidence: 97%

Section: Suitable Materials For Top Layermentioning

confidence: 99%

Advancement of Schottky Barrier Solar Cells: A Review

Chowdhury¹,

Mandal²

2020

Contemporary Issues in Computing

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“…Similar problems exist in the fabrication of oxide semiconductors. In the case of ITO, several methods for deposition; i.e., ion-beam sputtering [28], de and rf sputtering [29], electron-beam deposition [30], and spray technology [6] have all been utilized in the fabrication of solar cells. Efficient solar cells have been fabricated by several methods on both n-and p-type silicon.…”

Section: Caleulation Of the Effieie!iii!!fmentioning

confidence: 99%

MIS and SIS solar cells on polycrystalline silicon

Cheek¹,

Mertens

1980

Solar Cells

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Metal-Insulator-Semiconductor (MIS) and Semiconductor-Insulator-Semiconductor (SIS) structured solar cells have been considered a viable alternative to thermally diffused p-n junctions for use on polycrystalline thin-film silicon substrates. Early work indicated that thermal diffusion of a j~mction in polycrystalline silicon substrates could impose severe problems. Experimental investigations have shown that a p-n junction in polycrystalline silicon can have well behaved characteristics. The major efficiency loss mechanism, introduced by the presence of grain boundries, apparently does not come from the lower value of shunt resistance but from the additional recombination loss along the grain boundaries. This paper's purpose is to review the status of MIS and SIS solar cell technologies and assess the potential of these structures to meet low cost goals. Three major types of MIS/SIS solar cells are discussed in terms of structure, materials used in the fabrication, and the current collection under illumination~ The types of solar cells discussed include the thin metal MIS structure, the conducting oxide SIS structure, and the MIS inversion layer device. The specific advantages of a MIS/SIS solar cell are investigated by the use of theoretical calculations. The spectral response, short circuit current, open circuit voltage, fill factor, and cell efficiency have been calculated for the MIS/SIS case, the advanced diffused, and standard diffused solar cells. Several specific problem areas exist with these devices. The possible loss mechanisms in the MIS/SIS device are detailed, the cell stability and degradation mechanisms are identified, and the fabrication techniques amenable to large scale use are discussed. A major conclusion of the paper is that the MIS/SIS solar cells have no apparent advantage over diffused p-n junctions.

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“…Imperfections in silicon can cause efficiency variations across solar panels . For this reason, researchers developed LBIC to characterize the reproducibility and quality of solar panels on the assembly line . In a typical LBIC imaging experiment, a focused laser spot illuminates a small spot on the solar cell while an ammeter or potentiometer measures current or voltage from the cell .…”

Section: Introductionmentioning

confidence: 99%

LBIC Imaging of Solar Cells: An Introduction to Scanning Probe-Based Imaging Techniques

et al. 2023

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Scanning probe-based microscopes (SPMs) are widely used in biology, chemistry, materials science, and physics to image and manipulate matter on the nanoscale. Unfortunately, high school and university departments lack expensive SPM tools and materials microscopy activities to educate a large number of students in this vital SPM imaging technique. As a result, students face challenges participating in and contributing value to the nanotechnology revolution driving modern scientific innovations. Here we demonstrate an affordable scanning laser-based imaging system (approximately $400, excluding the computer) to introduce students to the point-by-point image formation process underlying SPM methods. In this laboratory activity, students learn how to construct and optimize images of a working solar panel using a laser beam-induced current (LBIC) imaging system. We envision undergraduate and graduate students should be able to use this LBIC system for independent solar energy research projects as well as apply fundamental knowledge and measurement skills to understand other SPM techniques.

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Fabrication and characterization of indium tin oxide (ITO)/polycrystalline silicon solar cells

Cited by 39 publications

References 8 publications

Advancement of Schottky Barrier Solar Cells: A Review

Advancement of Schottky Barrier Solar Cells: A Review

MIS and SIS solar cells on polycrystalline silicon

LBIC Imaging of Solar Cells: An Introduction to Scanning Probe-Based Imaging Techniques

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