Fabrication and characterization of thin films with perpendicular magnetic anisotropy for high-density magnetic recording

Chen, C. W.

doi:10.1007/bf00543593

Cited by 20 publications

(4 citation statements)

References 128 publications

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“…The structure and perpendicular magnetic properties of these films can be found in reference 5. The Ms values were within the reported range for Co-Cr films in this Cr concentration regime [ 18].…”

Section: Resultssupporting

confidence: 84%

Anomalous X-ray Scattering for Determination of Nanostructured Alloy Formation and Site-specific Chemistry of Bragg Peak

Chow

2002

MRS Proc.

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The properties of nanostructured films can be tailored by many factors such as composition, structure, preferred orientation, microstructure, interphase interface and grain boundaries. Compositional control of magnetic properties of recording media depends on the miscibility of constituent elements. However, for nanostructured materials with a large surfaceto-volume ratio of atoms, the miscibility at the nanoscale may not necessarily follow the prediction of conventional phase diagram that does not consider the effects of surface and interface. This limitation further complicates the prediction of phase separation at grain boundaries and interphase interface. Using anomalous x-ray scattering, the alloying and composition of a specific long range order of textured nanostructured films has been investigated. Such information may not be readily available from conventional characterization techniques.

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Section: Resultssupporting

confidence: 84%

Anomalous X-ray Scattering for Determination of Nanostructured Alloy Formation and Site-specific Chemistry of Bragg Peak

Chow

2002

MRS Proc.

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“…This work was followed by experiments carried out on ultrathin NiFe films grown on Cu(111) 2 which confirmed the interfacial nature of the perpendicular magnetic anisotropy (PMA) observed in this system. Within the last fifty years, a lot of work has been carried out on interfacial anisotropy both from theoretical and experimental points of view 3 4 5 6 7 8 . Nowadays, perpendicular interfacial anisotropy has become one of the main ingredients of novel magnetic memory elements employing out-of-plane magnetized (perpendicular) magnetic tunnel junctions (pMTJ) stacks 9 10 11 .…”

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confidence: 99%

Second order anisotropy contribution in perpendicular magnetic tunnel junctions

Timopheev¹,

Sousa²,

Chshiev³

et al. 2016

Sci Rep

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Hard-axis magnetoresistance loops were measured on perpendicular magnetic tunnel junction pillars of diameter ranging from 50 to 150 nm. By fitting these loops to an analytical model, the effective anisotropy fields in both free and reference layers were derived and their variations in temperature range between 340 K and 5 K were determined. It is found that a second-order anisotropy term of the form −K2cos4θ must be added to the conventional uniaxial –K1cos2θ term to explain the experimental data. This higher order contribution exists both in the free and reference layers. At T = 300 K, the estimated −K2/K1 ratios are 0.1 and 0.24 for the free and reference layers, respectively. The ratio is more than doubled at low temperatures changing the ground state of the reference layer from “easy-axis” to “easy-cone” regime. The easy-cone regime has clear signatures in the shape of the hard-axis magnetoresistance loops. The existence of this higher order anisotropy was also confirmed by ferromagnetic resonance experiments on FeCoB/MgO sheet films. It is of interfacial nature and is believed to be due to spatial fluctuations at the nanoscale of the first order anisotropy parameter at the FeCoB/MgO interface.

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“…11,12 However, the origin of the Ta addition effect has not yet been clarified. 12 We recently found that Co-Cr-Ta films grown under various conditions have a fine ''honeycomb-like'' compositional microstructure as a common feature, as opposed to the stripe-type structure commonly observed in Co-Cr films.…”

Section: ͓S0021-8979͑96͒09503-4͔mentioning

confidence: 99%

Magnetic microstructure observations of Co-Cr-Ta films using neutron scattering

Maeda

Rogers

Song

et al. 1996

Journal of Applied Physics

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Using small-angle neutron scattering (SANS), we examined the magnetic microstructure of Co-12 at. % Cr-2 at. % Ta films sputter-deposited at 200 °C. Nuclear magnetic resonance confirmed the presence of highly Co-enriched regions produced by compositional separation. The SANS spectrum exhibited a main magnetic scattering peak corresponding to a size of several nm in the magnetic microstructure. This is indicative of a fine and uniform distribution of Co-enriched regions suitable for high-density magnetic recording.

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Fabrication and characterization of thin films with perpendicular magnetic anisotropy for high-density magnetic recording

Cited by 20 publications

References 128 publications

Anomalous X-ray Scattering for Determination of Nanostructured Alloy Formation and Site-specific Chemistry of Bragg Peak

Anomalous X-ray Scattering for Determination of Nanostructured Alloy Formation and Site-specific Chemistry of Bragg Peak

Second order anisotropy contribution in perpendicular magnetic tunnel junctions

Magnetic microstructure observations of Co-Cr-Ta films using neutron scattering

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