Abstract:This article discusses a simple vacuum evaporation technique for deposition of CdTe thin films with different thicknesses (100, 200, 300, 400, and 500) nm on P-type silicon substrates. Then, V2O5 and SnO2 thin films were deposited as a buffer layer and window layer with a thickness of 100 nm respectively, using the same technique. In addition, other samples of these films have been deposited on a glass substrate for the purpose of studying optical transmission and their optical properties. X-ray diffraction (H… Show more
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