Fabrication of a phase photon sieve on an optical fiber tip by focused ion beam nanomachining for improved fiber to silicon photonics waveguide light coupling

Abstract

PSS) as an alternative, more advantageous method to the metallization prior to FIB milling. The near field scans of the intensity profile along the optical axis under fiber illumination of a laser at λ = 1.55 μm are presented. We have analyzed the focusing properties and demonstrated the validity of our structure for light coupling into silicon photonics waveguides with improved efficiency and alignment tolerance.

Optical fibre Fabry-Pérot interferometer based on inline microcavities for salinity and temperature sensing

“…The first step of the fabrication process is the cleaving of the multimode graded index fibre tips (GIF625, Thorlabs), with a 62.5 μm core diameter and a numerical aperture of 0.275, which is then etched for 5 minutes in 9.6% HF gel, creating a shallow cavity in the fibre tip at an etch rate of 750 nm/min. The 9.6% HF buffered gel formulation, commonly used in dentistry as porcelain etchant gel, has a reduced etch rate compared to buffered hydrofluoric acid based etchants, providing better control of the etching depth and being at the same time safer to handle 25,26 .…”

Fabrication of Fresnel plates on optical fibres by FIB milling for optical trapping, manipulation and detection of single cells

“…These can be responsible for blockage or absorption of the light, as addressed by Janeiro et al . 42 . In the particular case of the zone plates, the simulations have taken into account the dominant effect of the structure produced by the pattern on the fiber tip, but have left out second order corrections.…”

“…To address this challenge, several authors have proposed the use of distinct processes, such as: femtosecond pulsed laser micromachining 30, 31 , e-beam lithography 27 , focused ion beam milling 37–39 , among others 28, 40 . In this work, the fabrication of the Fresnel zone and phase plates is carried out using focused ion beam (FIB) milling 41, 42 .…”

Teaching an Old Material New Tricks: Easy and Inexpensive Focused Ion Beam (FIB) Sample Protection Using Conductive Polymers

“…In the microfabrication community, conductive polymers have long been used in electron-beam lithography (EBL) to enable ultra-high-resolution patterning on nonconductive substrates, and likewise can have similar benefits for FIB patterning (Dylewicz et al, 2011). Indeed, conductive polymers have been previously used to reduce the negative impacts of FIB charging during circuit edit, mask repair, and lithographic applications (Talbot & Trexler, 1994; Alias et al, 2015; Janeiro et al, 2016). This letter is the first report, however, extending their application to physical TEM lamella protection (to the authors’ knowledge).…”