International Topical Meeting on Microwave Photonics MWP-02 2002
DOI: 10.1109/mwp.2002.1158864
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Fabrication of broad-band fiber-optic magnetic field probe and its application to intensity and phase distribution measurements of GHz-frequency magnetic field

Abstract: Magneto-optic probes with bandwidths of 10 GHz or broader were implemented with the rotation magnetization in BiRlG crystals utilized. Two-dimensional RF magnetic field distributions were measured successfully over GHz-band microstrip line circuits.

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Cited by 7 publications
(4 citation statements)
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“…In comparison with measurement in a conventional anechoic chamber, the cables can be much shorter. An MO probe [76] combining an optical fiber and a magneto-optical device with even lower disturbance than the metallic loop is being studied as a device to pick up the magnetic field.…”
Section: Direct Observation Of the Equivalent Weight Vectormentioning
confidence: 99%
“…In comparison with measurement in a conventional anechoic chamber, the cables can be much shorter. An MO probe [76] combining an optical fiber and a magneto-optical device with even lower disturbance than the metallic loop is being studied as a device to pick up the magnetic field.…”
Section: Direct Observation Of the Equivalent Weight Vectormentioning
confidence: 99%
“…What's more, existing IC EMI techniques, which use metallic probes, are fairly invasive when applied to single die, and the local boundary condition is changed significantly. [4][5][6] In this article, we proposed and developed a technique to image the microwave magnetic field on chip surface based on the nitrogen-vacancy center (NV) in diamond. This method has a spatial resolution only limited by the physical size of diamond crystal, which is typically on the order of submicron to a few micrometer.…”
Section: Introductionmentioning
confidence: 99%
“…The coaxial probes that we have developed for EMC applications have a spatial resolution of 500 µm for monopole and around 1 mm for dipole probes which do not give enough experimental data with microelectronic components [7][8][9][10]. The optical probes can reach a spatial resolution under 100 µm and thus suitable for measuring microelectronic devices [11][12][13]. As a result, to improve the performance of our current near field bench based on passive detection with coaxial probes, and to analyze these interferences, we are currently developing another near-field test bench using optical technology based on the Pockels effect.…”
Section: Introductionmentioning
confidence: 99%