“…19 In this Letter, we have fabricated well-defined and more complicated nanoconstrained structures of (Fe,Mn) 3 O 4 (FMO), which is a very high temperature ferromagnetic oxide semiconductor, using two different steps involving atomic force microscope (AFM) lithography, originally developed by our team, and measured their electric and MR properties at room temperature. In the first step we placed an epitaxial ferromagnetic oxide nanowire (NW) in the nanoarea, which was selected by AFM tip scanning using a Mo nanomask liftoff technique (oxide deposition type 18,19 successive second step we reduced an oxide NW width at the selected point with higher controllability using a Mo nanomask AFM lithography technique (oxide removal type 20,21 ). Figure 1 shows a schematic illustration of the fabrication of a FMO nanoconstrained structure.…”